Inventor · disambiguated record
Weiping Fang
Also filed as: FANG WEIPING
19 granted patents·134 citations·filing 2006–2020
94Inventor score
Top patents by PatentIndex Score
19 records- 0191US7496884B2Distributed hierarchical partitioning framework for verifying a simulated wafer imageSYNOPSYS INC·Filed 2006·Granted Feb 24, 2009·17 cites·15 claims
- 0289US7861196B2System and method for multi-exposure pattern decompositionCADENCE DESIGN SYSTEMS INC·Filed 2008·Granted Dec 28, 2010·25 cites·31 claims
- 0388US9384319B2Detecting and displaying multi-patterning fix guidanceSYNOPSYS INC·Filed 2014·Granted Jul 5, 2016·14 cites·66 claims
- 0486US8677301B2Method and system for model-based design and layout of an integrated circuitLAI YA-CHIEH·Filed 2012·Granted Mar 18, 2014·8 cites·20 claims
- 0586US8151219B2System and method for multi-exposure pattern decompositionHUCKABAY JUDY·Filed 2010·Granted Apr 3, 2012·12 cites·26 claims
- 0684US7966586B2Intelligent pattern signature based on lithography effectsCADENCE DESIGN SYSTEMS INC·Filed 2007·Granted Jun 21, 2011·8 cites·23 claims
- 0783US8645887B2Method and system for model-based design and layout of an integrated circuitLAI YA-CHIEH·Filed 2012·Granted Feb 4, 2014·6 cites·20 claims
- 0883US8381152B2Method and system for model-based design and layout of an integrated circuitCADENCE DESIGN SYSTEMS INC·Filed 2008·Granted Feb 19, 2013·10 cites·33 claims
- 0981US10311195B2Incremental multi-patterning validationSYNOPSYS INC·Filed 2016·Granted Jun 4, 2019·3 cites·23 claims
- 1081US8701056B1Automated repair method and system for double patterning conflictsSYNOPSYS INC·Filed 2012·Granted Apr 15, 2014·8 cites·37 claims
- 1177US8341571B1Pattern signatureLEI JUNJIANG·Filed 2011·Granted Dec 25, 2012·5 cites·21 claims
- 1276US7904853B1Pattern signatureCADENCE DESIGN SYSTEMS INC·Filed 2007·Granted Mar 8, 2011·7 cites·18 claims
- 1375US7934174B2Method and apparatus for using a database to quickly identify and correct a manufacturing problem area in a layoutSYNOPSYS INC·Filed 2009·Granted Apr 26, 2011·7 cites·10 claims
- 1459US7584450B2Method and apparatus for using a database to quickly identify and correct a manufacturing problem area in a layoutSYNOPSYS INC·Filed 2006·Granted Sep 1, 2009·2 cites·14 claims
- 1552US8718382B2Scalable pattern matching between a pattern clip and a pattern libraryFANG WEIPING·Filed 2012·Granted May 6, 2014·2 cites·15 claims
- 1648US11487930B2Pattern matching using anchors during integrated circuit verificationSYNOPSYS INC·Filed 2020·Granted Nov 1, 2022·0 cites·20 claims
- 1747US10902176B2Detecting and displaying multi-patterning fix guidanceSYNOPSYS INC·Filed 2016·Granted Jan 26, 2021·0 cites·66 claims
- 1847US8291351B2Intelligent pattern signature based on lithography effectsLEI JUNJIANG·Filed 2011·Granted Oct 16, 2012·0 cites·10 claims
- 1945US8358828B2Interpolation of irregular data in a finite-dimensional metric space in lithographic simulationCADENCE DESIGN SYSTEMS INC·Filed 2007·Granted Jan 22, 2013·0 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →