Inventor · disambiguated record
Wen-Fang Lee
Also filed as: LEE WEN-FANG
44 granted patents·8 pending applications·204 citations·filing 2003–2024
97Inventor score
Top patents by PatentIndex Score
52 records- 0194US9741850B1Semiconductor device and method for forming the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted Aug 22, 2017·12 cites·25 claims
- 0293US10141398B1High voltage MOS structure and its manufacturing methodUNITED MICROELECTRONICS CORP·Filed 2017·Granted Nov 27, 2018·13 cites·13 claims
- 0392US9761657B2Metal-oxide-semiconductor transistor and method of forming gate layoutUNITED MICROELECTRONICS CORP·Filed 2015·Granted Sep 12, 2017·8 cites·7 claims
- 0492US9653460B1Semiconductor device and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted May 16, 2017·8 cites·10 claims
- 0592US7067365B1High-voltage metal-oxide-semiconductor devices and method of making the sameUNITED MICROELECTRONICS CORP·Filed 2005·Granted Jun 27, 2006·24 cites·13 claims
- 0691US9985129B2High-voltage metal-oxide-semiconductor transistor and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2017·Granted May 29, 2018·6 cites·7 claims
- 0791US9716139B2Method for forming high voltage transistorUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jul 25, 2017·8 cites·18 claims
- 0890US11495681B2Semiconductor device and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2020·Granted Nov 8, 2022·2 cites·16 claims
- 0989US7061029B1High-voltage device structureUNITED MICROELECTRONICS CORP·Filed 2005·Granted Jun 13, 2006·18 cites·18 claims
- 1087US9859417B2High-voltage metal-oxide-semiconductor transistor and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2016·Granted Jan 2, 2018·4 cites·14 claims
- 1186US9577069B1Method of fabricating semiconductor MOS deviceUNITED MICROELECTRONICS CORP·Filed 2016·Granted Feb 21, 2017·5 cites·12 claims
- 1284US10204996B2Metal-oxide-semiconductor transistor and method of forming gate layoutUNITED MICROELECTRONICS CORP·Filed 2017·Granted Feb 12, 2019·3 cites·5 claims
- 1384US7015100B1Method of fabricating one-time programmable read only memoryUNITED MICROELECTRONICS CORP·Filed 2004·Granted Mar 21, 2006·38 cites·7 claims
- 1483US9972678B2Semiconductor device and method of forming the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted May 15, 2018·3 cites·17 claims
- 1583US9224859B1High voltage metal-oxide-semiconductor transistor deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted Dec 29, 2015·4 cites·11 claims
- 1680US10411088B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2018·Granted Sep 10, 2019·2 cites·19 claims
- 1779US9391197B1Semiconductor device and operating method thereofUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jul 12, 2016·3 cites·22 claims
- 1879US7385274B2High-voltage metal-oxide-semiconductor devices and method of making the sameUNITED MICROELECTRONICS CORP·Filed 2006·Granted Jun 10, 2008·7 cites·12 claims
- 1979US2025031438A1Semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 2077US12426353B2Semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2023·Granted Sep 23, 2025·0 cites·8 claims
- 2177US9196695B2High-voltage metal-oxide semiconductor transistor and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2014·Granted Nov 24, 2015·3 cites·7 claims
- 2277US8692326B2High voltage metal-oxide-semiconductor transistor device and layout pattern thereofLEE MING-TSUNG·Filed 2012·Granted Apr 8, 2014·4 cites·20 claims
- 2373US7294548B2Semiconductor device and fabricating method thereofUNITED MICROELECTRONICS CORP·Filed 2005·Granted Nov 13, 2007·6 cites·17 claims
- 2471US9972539B2Method of fabricating semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2017·Granted May 15, 2018·1 cites·10 claims
- 2568US11735586B2Semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2021·Granted Aug 22, 2023·0 cites·25 claims
- 2668US6897116B2Method and structure to improve the gate coupling ratio (GCR) for manufacturing a flash memory deviceUNITED MICROELECTRONICS CORP·Filed 2003·Granted May 24, 2005·14 cites·17 claims
- 2767US8492835B1High voltage MOSFET deviceWANG CHIH-CHUNG·Filed 2012·Granted Jul 23, 2013·2 cites·9 claims
- 2864US8436418B2High-voltage semiconductor device with electrostatic discharge protectionWANG CHIH-CHUNG·Filed 2011·Granted May 7, 2013·2 cites·20 claims
- 2964US7763928B2Multi-time programmable memoryUNITED MICROELECTRONICS CORP·Filed 2007·Granted Jul 27, 2010·4 cites·6 claims
- 3057US12464762B2EDMOS and fabricating method of the sameUNITED MICROELECTRONICS CORP·Filed 2023·Granted Nov 4, 2025·0 cites·16 claims
- 3157US10497805B2Semiconductor structure and manufacturing method of the sameUNITED MICROELECTRONICS CORP·Filed 2018·Granted Dec 3, 2019·0 cites·10 claims
- 3257US2025102922A1Exposure method of semiconductor patternUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 3356US10475903B2Method of forming transistor with dual spacerUNITED MICROELECTRONICS CORP·Filed 2019·Granted Nov 12, 2019·0 cites·10 claims
- 3456US10290718B2Metal-oxide-semiconductor transistor and method of forming gate layoutUNITED MICROELECTRONICS CORP·Filed 2017·Granted May 14, 2019·0 cites·6 claims
- 3556US10084083B1Semiconductor structure and manufacturing method of the sameUNITED MICROELECTRONICS CORP·Filed 2017·Granted Sep 25, 2018·0 cites·10 claims
- 3656US2024429220A1Semiconductor structure and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 3755US10535734B2Method for fabricating semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2019·Granted Jan 14, 2020·0 cites·9 claims
- 3853US10453938B2Transistor with dual spacer and forming method thereofUNITED MICROELECTRONICS CORP·Filed 2017·Granted Oct 22, 2019·0 cites·7 claims
- 3953US10396157B1Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2018·Granted Aug 27, 2019·0 cites·11 claims
- 4052US8937352B2High voltage metal-oxide-semiconductor transistor device and layout pattern thereofUNITED MICROELECTRONICS CORP·Filed 2014·Granted Jan 20, 2015·0 cites·9 claims
- 4150US9484422B2High-voltage metal-oxide semiconductor transistorUNITED MICROELECTRONICS CORP·Filed 2015·Granted Nov 1, 2016·0 cites·12 claims
- 4245US8071440B2Method of fabricating a dynamic random access memoryLEE PO-SHENG·Filed 2008·Granted Dec 6, 2011·0 cites·14 claims
- 4344US7687847B2Semiconductor device and fabricating method thereofUNITED MICROELECTRONICS CORP·Filed 2007·Granted Mar 30, 2010·0 cites·4 claims
- 4442US9105493B2High voltage metal-oxide-semiconductor transistor device and layout pattern thereofLEE MING-TSUNG·Filed 2012·Granted Aug 11, 2015·0 cites·18 claims
- 4540US9852952B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2015·Granted Dec 26, 2017·0 cites·6 claims
- 4640US2008299729A1Method of fabricating high voltage mos transistor deviceLEE WEN-FANG·Filed 2007·Application pending·0 cites
- 4739US8698247B2Semiconductor deviceWANG CHIH-CHUNG·Filed 2011·Granted Apr 15, 2014·0 cites·11 claims
- 4838US2013320445A1High voltage metal-oxide-semiconductor transistor deviceLEE MING-TSUNG·Filed 2012·Application pending·0 cites
- 4936US2005127427A1Method and structure to improve the gate coupling ratio (GCR) for manufacturing a flash memory deviceUNITED MIRCOELECTRONICS CORP·Filed 2004·Application pending·0 cites
- 5035US2019103460A1Semiconductor transistor deviceUNITED MICROELECTRONICS CORP·Filed 2017·Application pending·0 cites
Showing the top 50 of 52 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →