Inventor · disambiguated record
Weiming Ren
Also filed as: REN WEIMING
102 granted patents·21 pending applications·711 citations·filing 2002–2025
99Inventor score
Top patents by PatentIndex Score
123 records- 0198US10879031B2Apparatus of plural charged-particle beamsASML NETHERLANDS BV·Filed 2019·Granted Dec 29, 2020·30 cites·20 claims
- 0298US10643820B2Apparatus of plural charged-particle beamsASML NETHERLANDS BV·Filed 2019·Granted May 5, 2020·29 cites·13 claims
- 0398US10141160B2Apparatus of plural charged-particle beamsHERMES MICROVISION INC·Filed 2016·Granted Nov 27, 2018·42 cites·76 claims
- 0498US10062541B2Apparatus of plural charged-particle beamsHERMES MICROVISION INC·Filed 2017·Granted Aug 28, 2018·34 cites·79 claims
- 0598US9922799B2Apparatus of plural charged-particle beamsHERMES MICROVISION INC·Filed 2016·Granted Mar 20, 2018·64 cites·22 claims
- 0698US9691586B2Apparatus of plural charged-particle beamsHERMES MICROVISION INC·Filed 2017·Granted Jun 27, 2017·64 cites·5 claims
- 0798US9691588B2Apparatus of plural charged-particle beamsHERMES MICROVISION INC·Filed 2016·Granted Jun 27, 2017·33 cites·19 claims
- 0898US9607805B2Apparatus of plural charged-particle beamsHERMES MICROVISION INC·Filed 2016·Granted Mar 28, 2017·62 cites·23 claims
- 0997US11804356B2Apparatus using multiple beams of charged particlesASML NETHERLANDS BV·Filed 2022·Granted Oct 31, 2023·2 cites·20 claims
- 1097US10395886B2Apparatus of plural charged-particle beamsASML NETHERLANDS BV·Filed 2016·Granted Aug 27, 2019·16 cites·44 claims
- 1197US8294095B2Apparatus of plural charged particle beams with multi-axis magnetic lensCHEN ZHONGWEI·Filed 2010·Granted Oct 23, 2012·51 cites·23 claims
- 1296US11705304B2Apparatus of plural charged-particle beamsASML NETHERLANDS BV·Filed 2021·Granted Jul 18, 2023·2 cites·18 claims
- 1395US11469074B2Multiple charged-particle beam apparatus with low crosstalkASML NETHERLANDS BV·Filed 2020·Granted Oct 11, 2022·3 cites·18 claims
- 1495US10236156B2Apparatus of plural charged-particle beamsHERMES MICROVISION INC·Filed 2016·Granted Mar 19, 2019·13 cites·32 claims
- 1594US11282675B2Multi-beam inspection apparatus with improved detection performance of signal electronsASML NETHERLANDS BV·Filed 2021·Granted Mar 22, 2022·2 cites·20 claims
- 1694US9000395B2Energy filter for charged particle beam apparatusHERMES MICROVISION INC·Filed 2014·Granted Apr 7, 2015·16 cites·6 claims
- 1794US8436317B1Wien filterCHEN ZHONGWEI·Filed 2011·Granted May 7, 2013·19 cites·26 claims
- 1893US10541110B2Apparatus of plural charged-particle beamsASML NETHERLANDS BV·Filed 2018·Granted Jan 21, 2020·5 cites·9 claims
- 1993US10109456B2Apparatus of plural charged-particle beamsHERMES MICROVISION INC·Filed 2017·Granted Oct 23, 2018·5 cites·26 claims
- 2093US7960697B2Electron beam apparatusHERMES MICROVISION INC·Filed 2008·Granted Jun 14, 2011·24 cites·20 claims
- 2192US12211669B2Multiple charged-particle beam apparatus with low crosstalkASML NETHERLANDS BV·Filed 2020·Granted Jan 28, 2025·3 cites·17 claims
- 2292US12033830B2Multiple charged-particle beam apparatus with low crosstalkASML NETHERLANDS BV·Filed 2022·Granted Jul 9, 2024·1 cites·20 claims
- 2392US9048062B1Method for improving performance of an energy filterHERMES MICROVISION INC·Filed 2015·Granted Jun 2, 2015·8 cites·13 claims
- 2492US8445862B2Apparatus of plural charged particle beams with multi-axis magnetic lensCHEN ZHONGWEI·Filed 2010·Granted May 21, 2013·16 cites·42 claims
- 2592US8003953B2Multi-axis magnetic lensHERMES MICROVISION INC·Filed 2009·Granted Aug 23, 2011·18 cites·14 claims
- 2692US7759653B2Electron beam apparatusHERMES MICROVISION INC·Filed 2008·Granted Jul 20, 2010·16 cites·11 claims
- 2792US7423268B2Projection imaging type electron microscopeNIKON CORP·Filed 2005·Granted Sep 9, 2008·17 cites·10 claims
- 2891US11043354B2Apparatus of plural charged-particle beamsASML NETHERLANDS BV·Filed 2020·Granted Jun 22, 2021·2 cites·17 claims
- 2991US10115559B2Apparatus of plural charged-particle beamsHERMES MICROVISION INC·Filed 2017·Granted Oct 30, 2018·4 cites·2 claims
- 3091US8274046B1Monochromator for charged particle beam apparatusREN WEIMING·Filed 2011·Granted Sep 25, 2012·13 cites·30 claims
- 3190US12196692B2Systems and methods for voltage contrast defect detectionASML NETHERLANDS BV·Filed 2020·Granted Jan 14, 2025·2 cites·20 claims
- 3290US10573487B2Apparatus of plural charged-particle beamsASML NETHERLANDS BV·Filed 2018·Granted Feb 25, 2020·3 cites·21 claims
- 3390US2025112023A1Apparatus of plural charged-particle beamsASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 3489US11594396B2Multi-beam inspection apparatus with single-beam modeASML NETHERLANDS BV·Filed 2020·Granted Feb 28, 2023·2 cites·14 claims
- 3589US11289304B2Apparatus using multiple beams of charged particlesASML NETHERLANDS BV·Filed 2018·Granted Mar 29, 2022·3 cites·15 claims
- 3689US10892138B2Multi-beam inspection apparatus with improved detection performance of signal electronsASML NETHERLANDS BV·Filed 2019·Granted Jan 12, 2021·3 cites·15 claims
- 3788US12237143B2Apparatus of plural charged-particle beamsASML NETHERLANDS BV·Filed 2023·Granted Feb 25, 2025·0 cites·20 claims
- 3888US9431209B2Apparatus of plural charged particle beams with multi-axis magnetic lensesHERMES-MICROVISION INC·Filed 2015·Granted Aug 30, 2016·5 cites·33 claims
- 3988US8421029B1Wien filter with reduced field leakageREN WEIMING·Filed 2011·Granted Apr 16, 2013·9 cites·39 claims
- 4087US11295930B2Method and apparatus for charged particle detectionASML NETHERLANDS BV·Filed 2018·Granted Apr 5, 2022·3 cites·15 claims
- 4187US9048063B1Electron beam apparatusHERMES MICROVISION INC·Filed 2015·Granted Jun 2, 2015·5 cites·15 claims
- 4286US12424408B2Apparatus of plural charged-particle beamsASML NETHERLANDS BV·Filed 2023·Granted Sep 23, 2025·0 cites·20 claims
- 4386US12237144B2Apparatus using multiple beams of charged particlesASML NETHERLANDS BV·Filed 2023·Granted Feb 25, 2025·0 cites·20 claims
- 4486US11398368B2Apparatus of plural charged-particle beamsASML NETHERLANDS BV·Filed 2020·Granted Jul 26, 2022·1 cites·20 claims
- 4585US11887807B2Apparatus of plural charged-particle beamsASML NETHERLANDS BV·Filed 2023·Granted Jan 30, 2024·0 cites·22 claims
- 4685US8319192B2Charged particle apparatusREN WEIMING·Filed 2010·Granted Nov 27, 2012·7 cites·23 claims
- 4784US9117626B1Energy-discrimination detection deviceHERMES MICROVISION INC·Filed 2015·Granted Aug 25, 2015·3 cites·14 claims
- 4884US9000370B2System and method for controlling charge-up in an electron beam apparatusHERMES MICROVISION INC·Filed 2014·Granted Apr 7, 2015·4 cites·2 claims
- 4983US12463010B2Multiple charged-particle beam apparatus and methodsASML NETHERLANDS BV·Filed 2023·Granted Nov 4, 2025·0 cites·21 claims
- 5083US11513087B2Systems and methods for voltage contrast defect detectionASML NETHERLANDS BV·Filed 2020·Granted Nov 29, 2022·1 cites·15 claims
Showing the top 50 of 123 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →