Inventor · disambiguated record
Xinghao Chen
Also filed as: CHEN XINGHAO
5 granted patents·7 pending applications·71 citations·filing 2000–2025
81Inventor score
Files withHUAWEI TECH CO LTD4CADENCE DESIGN SYSTEMS INC2CHEN XINGHAO2FUYAO GLASS IND GROUP CO LTD2BUSHNELL MICHAEL L1
Top patents by PatentIndex Score
12 records- 0179US7702980B2Scan-load-based dynamic scan configurationCHEN XINGHAO·Filed 2009·Granted Apr 20, 2010·13 cites·12 claims
- 0278US7535297B2Architecture and method for improving efficiency of a class-A power amplifier by dynamically scaling biasing current thereof as well as synchronously compensating gain thereof in order to maintain overall constant gain of the class-A power amplifier at all biasing configurations thereofCHEN XINGHAO·Filed 2007·Granted May 19, 2009·12 cites·4 claims
- 0378US6618826B1Test sequences generated by automatic test pattern generation and applicable to circuits with embedded multi-port RAMsCADENCE DESIGN SYSTEMS INC·Filed 2000·Granted Sep 9, 2003·33 cites·11 claims
- 0469US8164345B2Spectral and information theoretic method of test point, partial-scan, and full-scan flip-flop insertion to improve integrated circuit testabilityBUSHNELL MICHAEL L·Filed 2009·Granted Apr 24, 2012·9 cites·8 claims
- 0561US2025282202A1Vehicle window glass and vehicleFUYAO GLASS IND GROUP CO LTD·Filed 2025·Application pending·0 cites
- 0659US2024419947A1Data processing method and related deviceHUAWEI TECH CO LTD·Filed 2024·Application pending·0 cites
- 0756US2024316903A1Glass, glass assembly and vehicleFUYAO GLASS IND GROUP CO LTD·Filed 2024·Application pending·0 cites
- 0855US2025246015A1Data Processing Method and Related DeviceHUAWEI TECH CO LTD·Filed 2025·Application pending·0 cites
- 0953US2025156697A1Binary quantization method, neural network training method, device, and storage mediumHUAWEI TECH CO LTD·Filed 2025·Application pending·0 cites
- 1051US2023153615A1Neural network distillation method and apparatusHUAWEI TECH CO LTD·Filed 2022·Application pending·0 cites
- 1140US6922800B2Test sequences generated by automatic test pattern generation and applicable to circuits with embedded multi-port RAMsCADENCE DESIGN SYSTEMS INC·Filed 2003·Granted Jul 26, 2005·4 cites·9 claims
- 1228US2002188904A1Efficiency of fault simulation by logic backtrackingIBM·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →