Inventor · disambiguated record
Xuguang Jiang
Also filed as: JIANG XUGUANG
9 granted patents·6 citations·filing 2006–2021
76Inventor score
Top patents by PatentIndex Score
9 records- 0184US10324046B1Methods and systems for monitoring a non-defect related characteristic of a patterned waferKLA TENCOR CORP·Filed 2016·Granted Jun 18, 2019·5 cites·20 claims
- 0265US10533953B2System and method for wafer inspection with a noise boundary thresholdKLA TENCOR CORP·Filed 2016·Granted Jan 14, 2020·1 cites·24 claims
- 0355US11676260B2Variation-based segmentation for wafer defect detectionKLA CORP·Filed 2020·Granted Jun 13, 2023·0 cites·17 claims
- 0452US11610296B2Projection and distance segmentation algorithm for wafer defect detectionKLA CORP·Filed 2020·Granted Mar 21, 2023·0 cites·19 claims
- 0549US10372113B2Method for defocus detectionKLA TENCOR CORP·Filed 2017·Granted Aug 6, 2019·0 cites·19 claims
- 0642US10402963B2Defect detection on transparent or translucent wafersKLA TENCOR CORP·Filed 2017·Granted Sep 3, 2019·0 cites·19 claims
- 0739US10043265B2System, method and computer program product for identifying fabricated component defects using a local adaptive thresholdKLA TENCOR CORP·Filed 2016·Granted Aug 7, 2018·0 cites·21 claims
- 0837US11748871B2Alignment of a specimen for inspection and other processesKLA CORP·Filed 2021·Granted Sep 5, 2023·0 cites·19 claims
- 0935US7711164B2System and method for automatic segmentation of vessels in breast MR sequencesSIEMENS MEDICAL SOLUTIIONS USA·Filed 2006·Granted May 4, 2010·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →