Inventor · disambiguated record
Xuefeng Liu
Also filed as: LIU XUEFENG
130 granted patents·17 pending applications·941 citations·filing 2002–2025
99Inventor score
Files withIBM70KLA TENCOR CORP11KLA CORP10DING HANYI9GUANGDONG OPPO MOBILE TELECOMMUNICATIONS CORP LTD6
Top patents by PatentIndex Score
147 records- 0199US8519892B2Integrated millimeter wave antenna and transceiver on a substrateDING HANYI·Filed 2012·Granted Aug 27, 2013·197 cites·19 claims
- 0298US10748730B2Photocathode including field emitter array on a silicon substrate with boron layerKLA TENCOR CORP·Filed 2016·Granted Aug 18, 2020·16 cites·27 claims
- 0397US8675188B2Method and system for determining one or more optical characteristics of structure of a semiconductor waferKLA TENCOR CORP·Filed 2013·Granted Mar 18, 2014·33 cites·29 claims
- 0496US10504889B1Integrating a junction field effect transistor into a vertical field effect transistorIBM·Filed 2018·Granted Dec 10, 2019·13 cites·10 claims
- 0596US9991267B1Forming eDRAM unit cell with VFET and via capacitanceIBM·Filed 2017·Granted Jun 5, 2018·12 cites·16 claims
- 0696US9991365B1Forming vertical transport field effect transistors with uniform bottom spacer thicknessIBM·Filed 2017·Granted Jun 5, 2018·12 cites·15 claims
- 0796US9291554B2Method of electromagnetic modeling of finite structures and finite illumination for metrology and inspectionKUZNETSOV ALEXANDER·Filed 2014·Granted Mar 22, 2016·67 cites·23 claims
- 0896US8860937B1Metrology systems and methods for high aspect ratio and large lateral dimension structuresKLA TENCOR CORP·Filed 2013·Granted Oct 14, 2014·35 cites·19 claims
- 0996US7323948B2Vertical LC tank deviceIBM·Filed 2005·Granted Jan 29, 2008·43 cites·8 claims
- 1095US11567391B1Frequency conversion using interdigitated nonlinear crystal gratingsKLA CORP·Filed 2021·Granted Jan 31, 2023·5 cites·21 claims
- 1195US10325004B1Method of optimizing an optical parametric model for structural analysis using optical critical dimension (OCD) metrologyDZIURA THADDEUS G·Filed 2016·Granted Jun 18, 2019·11 cites·14 claims
- 1294US8035190B2Semiconductor devicesIBM·Filed 2010·Granted Oct 11, 2011·15 cites·10 claims
- 1394US7242071B1Semiconductor structureIBM·Filed 2006·Granted Jul 10, 2007·30 cites·24 claims
- 1493US10948423B2Sensitive particle detection with spatially-varying polarization rotator and polarizerKLA CORP·Filed 2019·Granted Mar 16, 2021·7 cites·31 claims
- 1593US7564319B2Vertical LC tank deviceIBM·Filed 2007·Granted Jul 21, 2009·24 cites·21 claims
- 1692US10197501B2Electron-bombarded charge-coupled device and inspection systems using EBCCD detectorsKLA TENCOR CORP·Filed 2012·Granted Feb 5, 2019·11 cites·23 claims
- 1792US10133181B2Electron sourceKLA TENCOR CORP·Filed 2016·Granted Nov 20, 2018·7 cites·23 claims
- 1891US10811528B2Two step fin etch and reveal for VTFETs and high breakdown LDVTFETsIBM·Filed 2018·Granted Oct 20, 2020·7 cites·6 claims
- 1991US9279106B2Immortalization of epithelial cells and methods of useSCHLEGEL RICHARD·Filed 2011·Granted Mar 8, 2016·19 cites·10 claims
- 2090US10558123B2Electron sourceKLA TENCOR CORP·Filed 2018·Granted Feb 11, 2020·4 cites·19 claims
- 2190US9966230B1Multi-column electron beam lithography including field emitters on a silicon substrate with boron layerKLA TENCOR CORP·Filed 2017·Granted May 8, 2018·6 cites·20 claims
- 2290US9786656B1Integration of bipolar transistor into complimentary metal-oxide-semiconductor processIBM·Filed 2016·Granted Oct 10, 2017·6 cites·20 claims
- 2390US7989306B2Method of forming alternating regions of Si and SiGe or SiGeC on a buried oxide layer on a substrateIBM·Filed 2007·Granted Aug 2, 2011·13 cites·5 claims
- 2488US7271693B2On-chip inductor with magnetic coreIBM·Filed 2006·Granted Sep 18, 2007·13 cites·6 claims
- 2588US7071530B1Multiple layer structure for substrate noise isolationIBM·Filed 2005·Granted Jul 4, 2006·18 cites·20 claims
- 2687US9054793B2Structure, system and method for device radio frequency (RF) reliabilityIBM·Filed 2013·Granted Jun 9, 2015·8 cites·20 claims
- 2786US11067389B2Overlay metrology system and methodKLA TENCOR CORP·Filed 2018·Granted Jul 20, 2021·4 cites·29 claims
- 2886US8421183B2Structure of very high insertion loss of the substrate noise decouplingDING HANYI·Filed 2011·Granted Apr 16, 2013·6 cites·14 claims
- 2986US8232920B2Integrated millimeter wave antenna and transceiver on a substrateDING HANYI·Filed 2008·Granted Jul 31, 2012·15 cites·17 claims
- 3086US7943404B2Integrated millimeter wave antenna and transceiver on a substrateIBM·Filed 2008·Granted May 17, 2011·17 cites·18 claims
- 3186US7329940B2Semiconductor structure and method of manufactureIBM·Filed 2005·Granted Feb 12, 2008·10 cites·24 claims
- 3284US9837351B1Avoiding gate metal via shorting to source or drain contactsIBM·Filed 2016·Granted Dec 5, 2017·3 cites·16 claims
- 3384US8832611B2Process aware metrologyKLA TENCOR CORP·Filed 2013·Granted Sep 9, 2014·5 cites·13 claims
- 3483US10727273B2Magnetoresistive random access memory thin film transistor unit cellIBM·Filed 2018·Granted Jul 28, 2020·2 cites·20 claims
- 3583US8468471B2Process aware metrologyLIU XUEFENG·Filed 2012·Granted Jun 18, 2013·5 cites·23 claims
- 3683US8288244B2Lateral passive device having dual annular electrodesCOLLINS DAVID S·Filed 2010·Granted Oct 16, 2012·6 cites·4 claims
- 3783US6770127B2Multigrade asphalt power additiveSHANDONG HERITAGE HIGHWAY MATE·Filed 2002·Granted Aug 3, 2004·28 cites·30 claims
- 3882US9448162B2Time-resolved single-photon or ultra-weak light multi-dimensional imaging spectrum system and methodZHAI GUANGJIE·Filed 2012·Granted Sep 20, 2016·9 cites·12 claims
- 3982US8399927B2Semiconductor structure including a high performance fet and a high voltage fet on an SOI substrateDING HANYI·Filed 2012·Granted Mar 19, 2013·5 cites·12 claims
- 4082US7759243B2Method for forming an on-chip high frequency electro-static discharge deviceIBM·Filed 2008·Granted Jul 20, 2010·10 cites·20 claims
- 4182US7061359B2On-chip inductor with magnetic coreIBM·Filed 2003·Granted Jun 13, 2006·27 cites·9 claims
- 4281US10276558B1Electrostatic discharge protection using vertical fin CMOS technologyIBM·Filed 2017·Granted Apr 30, 2019·3 cites·18 claims
- 4381US10041048B2Immortalization of epithelial cells and methods of useUNIV GEORGETOWN·Filed 2016·Granted Aug 7, 2018·2 cites·16 claims
- 4481US9951315B2Immortalization of epithelial cells and methods of useUNIV GEORGETOWN·Filed 2016·Granted Apr 24, 2018·2 cites·20 claims
- 4580US11231362B1Multi-environment polarized infrared reflectometer for semiconductor metrologyKLA CORP·Filed 2019·Granted Jan 25, 2022·1 cites·20 claims
- 4680US8338265B2Silicided trench contact to buried conductive layerCOOLBAUGH DOUGLAS D·Filed 2008·Granted Dec 25, 2012·7 cites·16 claims
- 4779US11855262B2Electronic deviceDONGGUAN NVT TECH CO LTD·Filed 2023·Granted Dec 26, 2023·0 cites·14 claims
- 4878US10934203B2Thermoforming method and thermoforming device for glass productAAC TECHNOLOGIES PTE LTD·Filed 2018·Granted Mar 2, 2021·1 cites·2 claims
- 4978US10388572B2Integrating metal-insulator-metal capacitors with fabrication of vertical field effect transistorsIBM·Filed 2017·Granted Aug 20, 2019·2 cites·8 claims
- 5078US8951893B2Fabricating polysilicon MOS devices and passive ESD devicesIBM·Filed 2013·Granted Feb 10, 2015·3 cites·11 claims
Showing the top 50 of 147 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →