Inventor · disambiguated record
Yasuhiko Nara
Also filed as: NARA YASUHIKO · NOZOE MARI
43 granted patents·7 pending applications·604 citations·filing 2001–2021
98Inventor score
Top patents by PatentIndex Score
50 records- 0196US6388747B2Inspection method, apparatus and system for circuit patternHITACHI LTD·Filed 2001·Granted May 14, 2002·62 cites·2 claims
- 0295US6759655B2Inspection method, apparatus and system for circuit patternHITACHI LTD·Filed 2001·Granted Jul 6, 2004·74 cites·4 claims
- 0395US6421122B2Inspection method, apparatus and system for circuit patternHITACHI LTD·Filed 2001·Granted Jul 16, 2002·51 cites·5 claims
- 0493US6567168B2Inspection method, apparatus and system for circuit patternHITACHI LTD·Filed 2001·Granted May 20, 2003·38 cites·4 claims
- 0592US7425704B2Inspection method and apparatus using an electron beamHITACHI HIGH TECH CORP·Filed 2006·Granted Sep 16, 2008·14 cites·7 claims
- 0691US7034298B2Inspection method and apparatus using an electron beamHITACHI HIGH TECH CORP·Filed 2003·Granted Apr 25, 2006·31 cites·14 claims
- 0791US6493082B2Inspection method, apparatus and system for circuit patternHITACHI LTD·Filed 2002·Granted Dec 10, 2002·35 cites·4 claims
- 0888US6480279B2Inspection method, apparatus and system for circuit patternHITACHI LTD·Filed 2001·Granted Nov 12, 2002·23 cites·2 claims
- 0987US6919564B2Inspection method, apparatus and system for circuit patternHITACHI LTD·Filed 2002·Granted Jul 19, 2005·23 cites·1 claims
- 1086US7133550B2Pattern inspection method and apparatusHITACHI LTD·Filed 2001·Granted Nov 7, 2006·19 cites·15 claims
- 1186US6898305B2Circuit pattern inspection method and apparatusHITACHI LTD·Filed 2001·Granted May 24, 2005·40 cites·24 claims
- 1283US7957579B2Pattern inspection method and apparatusHITACHI LTD·Filed 2007·Granted Jun 7, 2011·5 cites·11 claims
- 1383US7894658B2Pattern inspection method and apparatusHITACHI LTD·Filed 2007·Granted Feb 22, 2011·4 cites·17 claims
- 1482US7663104B2Specimen inspection equipment and how to make electron beam absorbed current imagesHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 16, 2010·6 cites·8 claims
- 1582US7532328B2Circuit-pattern inspection apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted May 12, 2009·7 cites·3 claims
- 1682US6903821B2Inspection method, apparatus and system for circuit patternHITACHI LTD·Filed 2002·Granted Jun 7, 2005·15 cites·6 claims
- 1781US7129727B2Defect inspecting apparatusHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 31, 2006·13 cites·20 claims
- 1880US7266235B2Pattern inspection method and apparatusHITACHI LTD·Filed 2001·Granted Sep 4, 2007·10 cites·13 claims
- 1979US7732791B2Semiconductor testing method and semiconductor testerHITACHI HIGH TECH CORP·Filed 2007·Granted Jun 8, 2010·5 cites·19 claims
- 2079US7269280B2Method and its apparatus for inspecting a patternHITACHI LTD·Filed 2002·Granted Sep 11, 2007·22 cites·26 claims
- 2179US7071468B2Circuit pattern inspection method and its apparatusHITACHI HIGH TECH CORP·Filed 2004·Granted Jul 4, 2006·16 cites·6 claims
- 2277US7292327B2Circuit-pattern inspection apparatusHITACHI HIGH TECH CORP·Filed 2004·Granted Nov 6, 2007·21 cites·12 claims
- 2376US7875156B2Probe storage container, prober apparatus, probe arranging method and manufacturing method of probe storage containerHITACHI HIGH TECH CORP·Filed 2008·Granted Jan 25, 2011·7 cites·6 claims
- 2475US7223975B2Inspection apparatus for circuit patternHITACHI HIGH TECH CORP·Filed 2004·Granted May 29, 2007·10 cites·6 claims
- 2575US6975754B2Circuit pattern inspection method and apparatusHITACHI LTD·Filed 2001·Granted Dec 13, 2005·19 cites·42 claims
- 2674US7457453B2Pattern inspection method and apparatusHITACHI LTD·Filed 2007·Granted Nov 25, 2008·4 cites·4 claims
- 2770US7989766B2Sample inspection apparatusHITACHI HIGH TECH CORP·Filed 2009·Granted Aug 2, 2011·2 cites·17 claims
- 2870US6504609B2Inspection method, apparatus and system for circuit patternHITACHI LTD·Filed 2002·Granted Jan 7, 2003·7 cites·2 claims
- 2969US8178840B2Specimen inspection equipment and how to make the electron beam absorbed current imagesOBUKI TOMOHARU·Filed 2010·Granted May 15, 2012·2 cites·5 claims
- 3068US7855363B2Inspection method and apparatus using an electron beamHITACHI HIGH TECH CORP·Filed 2008·Granted Dec 21, 2010·1 cites·11 claims
- 3161US8816712B2Inspection deviceNAKAMURA MITSUHIRO·Filed 2009·Granted Aug 26, 2014·4 cites·9 claims
- 3259USD637098SSemiconductor testing machineHITACHI HIGH TECH CORP·Filed 2010·Granted May 3, 2011·10 cites·1 claims
- 3359US2010019148A1Inspection apparatus for circuit patternHITACHI HIGH TECH CORP·Filed 2009·Application pending·0 cites
- 3458US11391756B2Probe module and probeHITACHI HIGH TECH CORP·Filed 2018·Granted Jul 19, 2022·0 cites·13 claims
- 3558US7700916B2Logical CAD navigation for device characteristics evaluation systemHITACHI HIGH TECH CORP·Filed 2006·Granted Apr 20, 2010·2 cites·19 claims
- 3655US2007284526A1Inspection apparatus for circuit patternHITACHI HIGH TECH CORP·Filed 2007·Application pending·0 cites
- 3752US12461126B2Probe deviceHITACHI HIGH TECH CORP·Filed 2021·Granted Nov 4, 2025·0 cites·14 claims
- 3852US2019062878A1Aluminum alloy substrate for magnetic recording medium, substrate for magnetic recording medium, magnetic recording medium, and hard disk driveSHOWA DENKO KK·Filed 2018·Application pending·0 cites
- 3949US10712384B2Circuit inspection method and sample inspection apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Jul 14, 2020·0 cites·15 claims
- 4048US8067752B2Semiconductor testing method and semiconductor testerANDO TOHRU·Filed 2010·Granted Nov 29, 2011·0 cites·10 claims
- 4147US10782340B2Dynamic response analysis prober deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Sep 22, 2020·0 cites·8 claims
- 4247US2008002876A1Method and its apparatus for inspecting a patternHIROI TAKASHI·Filed 2007·Application pending·0 cites
- 4346US11709199B2Evaluation apparatus for semiconductor deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Jul 25, 2023·0 cites·5 claims
- 4445US7049587B2Apparatus for inspecting a specimenHITACHI LTD·Filed 2002·Granted May 23, 2006·2 cites·20 claims
- 4545US2011093991A1Probe Storage Container, Prober Apparatus, Probe Arranging Method and Manufacturing Method of Probe Storage ContainerHITACHI HIGH TECH CORP·Filed 2010·Application pending·0 cites
- 4643US11977099B2Method for manufacturing semiconductor deviceHITACHI HIGH TECH CORP·Filed 2018·Granted May 7, 2024·0 cites·7 claims
- 4743US8178837B2Logical CAD navigation for device characteristics evaluation systemANDO TOHRU·Filed 2010·Granted May 15, 2012·0 cites·8 claims
- 4838US2007131877A9Pattern inspection method and system thereforHIROI TAKASHI·Filed 2002·Application pending·0 cites
- 4932US8754664B2Inspection method and deviceNARA YASUHIKO·Filed 2011·Granted Jun 17, 2014·0 cites·20 claims
- 5031US2013119999A1Specimen Testing Device and Method for Creating Absorbed Current ImageOBUKI TOMOHARU·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →