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Semiconductor testing machine

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Assignee: HITACHI HIGH TECH CORPPriority: Oct 30, 2009Filed: Apr 26, 2010Granted: May 3, 2011
Est. expiryOct 30, 2029(~3.3 yrs left)· nominal 20-yr term from priority
Inventors:Mitsuru OonumaAkira OmachiKazuhiko NishiyamaHiroyuki SuzukiYasuhiko Nara
59
PatentIndex Score
10
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3
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for a semiconductor testing machine, as shown.

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