Inventor · disambiguated record
Yiping Xu
Also filed as: XU YIPING
8 granted patents·3 pending applications·682 citations·filing 1992–2025
91Inventor score
Files withKLA TENCOR CORP4KLA TENCOR TECH CORP2WYKO CORP2GEN ELECTRIC1RAINTREE SCIENTIFIC INSTR SHANGHAI CORP1
Top patents by PatentIndex Score
11 records- 0197US6590656B2Spectroscopic scatterometer systemKLA TENCOR CORP·Filed 2001·Granted Jul 8, 2003·172 cites·59 claims
- 0297US6483580B1Spectroscopic scatterometer systemKLA TENCOR TECH CORP·Filed 1998·Granted Nov 19, 2002·263 cites·155 claims
- 0391US6358014B1Composite spinner and method of making the sameGEN ELECTRIC·Filed 2000·Granted Mar 19, 2002·68 cites·17 claims
- 0491US5555471AMethod for measuring thin-film thickness and step height on the surface of thin-film/substrate test samples by phase-shifting interferometryWYKO CORP·Filed 1995·Granted Sep 10, 1996·116 cites·12 claims
- 0590US7859659B2Spectroscopic scatterometer systemKLA TENCOR CORP·Filed 2006·Granted Dec 28, 2010·19 cites·9 claims
- 0684US7173699B2Spectroscopic scatterometer systemKLA TENCOR TECH CORP·Filed 2002·Granted Feb 6, 2007·20 cites·112 claims
- 0781US7898661B2Spectroscopic scatterometer systemKLA TENCOR CORP·Filed 2009·Granted Mar 1, 2011·6 cites·28 claims
- 0856US2025283878A1Nucleic acid aptamer test strip, preparation method therefor, and use thereofUNIV QINGDAO AGRICULTURAL·Filed 2025·Application pending·0 cites
- 0955US5321497AInterferometric integration technique and apparatus to confine 2π discontinuityWYKO CORP·Filed 1992·Granted Jun 14, 1994·18 cites·26 claims
- 1049US2011125458A1Spectroscopic Scatterometer SystemKLA TENCOR CORP·Filed 2010·Application pending·0 cites
- 1121US2015198434A1Method and apparatus for measuring critical dimension of semiconductorRAINTREE SCIENTIFIC INSTR SHANGHAI CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →