Inventor · disambiguated record
Yoshiharu Shirakawabe
Also filed as: SHIRAKAWABE YOSHIHARU
25 granted patents·4 pending applications·381 citations·filing 1997–2007
96Inventor score
Files withSEIKO INSTR INC14SII NANOTECHNOLOGY INC6NAKAYAMA YOSHIKAZU3SHIRAKAWABE YOSHIHARU2NIHEI AMIKO1
Top patents by PatentIndex Score
29 records- 0187US6422069B1Self-exciting and self-detecting probe and scanning probe apparatusSEIKO INSTR INC·Filed 2000·Granted Jul 23, 2002·41 cites·15 claims
- 0282US6759653B2Probe for scanning microscope produced by focused ion beam machiningYOSHIKAZU NAKAYAMA·Filed 2001·Granted Jul 6, 2004·32 cites·8 claims
- 0374US7337656B2Surface characteristic analysis apparatusSII NANOTECHNOLOGY INC·Filed 2005·Granted Mar 4, 2008·4 cites·14 claims
- 0473US6953519B2Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatusSII NANOTECHNOLOGY INC·Filed 2003·Granted Oct 11, 2005·15 cites·29 claims
- 0573US6787769B2Conductive probe for scanning microscope and machining method using the sameNAKAYAMA YOSHIKAZU·Filed 2001·Granted Sep 7, 2004·21 cites·9 claims
- 0673US6667467B2Microprobe and scanning probe apparatus having microprobeSEIKO INSTR INC·Filed 2001·Granted Dec 23, 2003·30 cites·10 claims
- 0772US6705154B2Cantilever for vertical scanning microscope and probe for vertical scan microscopeNAKAYAMA YOSHIKAZU·Filed 2001·Granted Mar 16, 2004·20 cites·9 claims
- 0871US6469293B1Multiprobe and scanning probe microscopeSEIKO INSTR INC·Filed 2000·Granted Oct 22, 2002·28 cites·27 claims
- 0969US6941798B2Scanning probe microscope and operation methodSII NANOTECHNOLOGY INC·Filed 2003·Granted Sep 13, 2005·18 cites·11 claims
- 1067US7398678B2Probe for a scanning microscopeNAKAYAMA YOSHIKAZU·Filed 2005·Granted Jul 15, 2008·4 cites·3 claims
- 1165US6932504B2Heated self-detecting type cantilever for atomic force microscopeSII NANOTECHNOLOGY INC·Filed 2003·Granted Aug 23, 2005·12 cites·5 claims
- 1265US6664540B2Microprobe and sample surface measuring apparatusSEIKO INSTR INC·Filed 2001·Granted Dec 16, 2003·14 cites·20 claims
- 1362US6383823B1Probe for scanning probe microscope (SPM) and SPM deviceSEIKO INSTR INC·Filed 1999·Granted May 7, 2002·26 cites·40 claims
- 1462US6171437B1Semiconductor manufacturing deviceSEIKO INSTR INC·Filed 1998·Granted Jan 9, 2001·27 cites·24 claims
- 1561US7456400B2Scanning probe microscope and scanning methodSEIKO INSTR INC·Filed 2005·Granted Nov 25, 2008·7 cites·18 claims
- 1659US7823470B2Cantilever and cantilever manufacturing methodSEIKO INSTR INC·Filed 2007·Granted Nov 2, 2010·3 cites·7 claims
- 1759US6211540B1Semiconductor strain sensor and scanning probe microscope using the semiconductor strain sensorSEIKO INSTR INC·Filed 1998·Granted Apr 3, 2001·22 cites·27 claims
- 1854US7476418B2Method for fabricating nanometer-scale structureSII NANOTECHNOLOGY INC·Filed 2004·Granted Jan 13, 2009·1 cites·24 claims
- 1952US6388252B1Self-detecting type of SPM probe and SPM deviceSEIKO INSTR INC·Filed 1998·Granted May 14, 2002·16 cites·15 claims
- 2050US2007134787A1Living cell observing cellSHIRAKAWABE YOSHIHARU·Filed 2006·Application pending·0 cites
- 2146US6405583B1Correlation sample for scanning probe microscope and method of processing the correlation sampleSEIKO INSTR INC·Filed 1999·Granted Jun 18, 2002·16 cites·18 claims
- 2246US6049115AScanning probe microscope, and semiconductor distortion sensor for use thereinSEIKO INSTR INC·Filed 1997·Granted Apr 11, 2000·12 cites·25 claims
- 2345US8859279B2Cell detachment methodNIHEI AMIKO·Filed 2007·Granted Oct 14, 2014·0 cites·17 claims
- 2445US5992225ACantilever probe and scanning type probe microscope utilizing the cantilever probeSEIKO INSTR INC·Filed 1997·Granted Nov 30, 1999·10 cites·34 claims
- 2545US2007278405A1Multi-tip surface cantilever probeSHIRAKAWABE YOSHIHARU·Filed 2007·Application pending·0 cites
- 2636US7494575B2Method for manufacturing a split probeSII NANOTECHNOLOGY INC·Filed 2004·Granted Feb 24, 2009·0 cites·20 claims
- 2736US2002179833A1SPM physical characteristic measuring method, measurement program, and SPM deviceFiled 2002·Application pending·0 cites
- 2836US2002178801A1Self-detecting type SPM probeFiled 2002·Application pending·0 cites
- 2928US6294099B1Method of processing circular patterningSEIKO INSTR INC·Filed 1998·Granted Sep 25, 2001·2 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →