Inventor · disambiguated record
Yoshihumi Tahara
Also filed as: TAHARA YOSHIHUMI
1 granted patent·3 pending applications·11 citations·filing 2004–2010
40Inventor score
Technology areasG01R
Top patents by PatentIndex Score
4 records- 0187US8255198B2Method and structure to develop a test program for semiconductor integrated circuitsKRISHNASWAMY RAMACHANDRAN·Filed 2010·Granted Aug 28, 2012·11 cites·12 claims
- 0241US2008016396A1Test emulator, test module emulator and record medium storing program thereinADVANTEST CORP·Filed 2007·Application pending·0 cites
- 0341US2008010524A1Test emulator, test module emulator and record medium storing program thereinADVANTEST CORP·Filed 2007·Application pending·0 cites
- 0433US2005039079A1Test emulator, test module emulator, and record medium storing program thereinFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →