Inventor · disambiguated record
Yuki Chiba
Also filed as: CHIBA YUKI
16 granted patents·15 pending applications·51 citations·filing 2001–2024
90Inventor score
Top patents by PatentIndex Score
31 records- 0186US8859430B2Sidewall protection of low-K material during etching and ashingCHIBA YUKI·Filed 2012·Granted Oct 14, 2014·10 cites·16 claims
- 0286US8242019B2Selective deposition of metal-containing cap layers for semiconductor devicesISHIZAKA TADAHIRO·Filed 2009·Granted Aug 14, 2012·12 cites·9 claims
- 0380US7723238B2Method for preventing striation at a sidewall of an opening of a resist during an etching processTOKYO ELECTRON LTD·Filed 2005·Granted May 25, 2010·8 cites·14 claims
- 0469US8012880B2Method of manufacturing semiconductor deviceTOKYO ELECTRON LTD·Filed 2008·Granted Sep 6, 2011·3 cites·7 claims
- 0569US7799703B2Processing method and storage mediumTOKYO ELECTRON LTD·Filed 2008·Granted Sep 21, 2010·3 cites·5 claims
- 0667US9298739B2Position information providing apparatus, position information providing system, position information providing method, program, and recording mediumMIYAZAKI YOJI·Filed 2011·Granted Mar 29, 2016·2 cites·12 claims
- 0765US8484491B2Power supply apparatus and power supply control methodKAGEYAMA HIRONOBU·Filed 2010·Granted Jul 9, 2013·4 cites·6 claims
- 0865US8357615B2Method of manufacturing semiconductor deviceTOKYO ELECTRON LTD·Filed 2008·Granted Jan 22, 2013·2 cites·15 claims
- 0964US9606138B2Motion recognition apparatus, motion recognition system, and motion recognition methodCHIBA YUKI·Filed 2013·Granted Mar 28, 2017·1 cites·20 claims
- 1064US8524101B2Method and apparatus for manufacturing semiconductor device, and storage mediumCHIBA YUKI·Filed 2008·Granted Sep 3, 2013·2 cites·13 claims
- 1159US12423348B2Classification apparatus, classification method and computer readable mediumNEC CORP·Filed 2023·Granted Sep 23, 2025·0 cites·10 claims
- 1259US2024162047A1Etching method, method for manufacturing semiconductor device, etching program, and plasma processing apparatusTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 1358US2025096006A1Etching method and plasma processing apparatusTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 1452US7922865B2Magnetic field generator for magnetron plasma, and plasma etching apparatus and method comprising the magnetic field generatorSHINETSU CHEMICAL CO·Filed 2001·Granted Apr 12, 2011·4 cites·11 claims
- 1552US2014195300A1Site of interest extraction device, site of interest extraction method, and computer-readable recording mediumCHIBA YUKI·Filed 2012·Application pending·0 cites
- 1650US11776786B2Focus adjustment method for charged particle beam device and charged particle beam deviceJEOL LTD·Filed 2020·Granted Oct 3, 2023·0 cites·6 claims
- 1750US2013096982A1Interest level estimation apparatus, interest level estimation method, and computer-readable recording mediumMIYAZAKI YOJI·Filed 2011·Application pending·0 cites
- 1848US2025155509A1Battery state estimation apparatus, battery state estimation method, and storage mediumNEC CORP·Filed 2022·Application pending·0 cites
- 1946US2024102813A1Route design system, cost function learning device, designed route output device, method, and programNEC CORP·Filed 2021·Application pending·0 cites
- 2044US2008045025A1Semiconductor device manufacturing methodTOKYO ELECTRON LTD·Filed 2007·Application pending·0 cites
- 2143US10949755B2Prediction result display system, prediction result display method, and prediction result display programNEC CORP·Filed 2016·Granted Mar 16, 2021·0 cites·11 claims
- 2243US2016295514A1Information terminal, movement estimation method, and storage mediumNEC CORP·Filed 2014·Application pending·0 cites
- 2343US2007218691A1Plasma etching method, plasma etching apparatus and computer-readable storage mediumTOKYO ELECTRON LTD·Filed 2007·Application pending·0 cites
- 2442US12194987B2Dangerous scene prediction device, dangerous scene prediction method, and dangerous scene prediction programNEC CORP·Filed 2019·Granted Jan 14, 2025·0 cites·6 claims
- 2541US12103543B2Comfort driving data collection system, driving control device, method, and programNEC CORP·Filed 2020·Granted Oct 1, 2024·0 cites·9 claims
- 2640US2024395075A1Support system, support method, and support programNEC CORP·Filed 2021·Application pending·0 cites
- 2740US2025148844A1Component state estimation apparatus, component state estimation method, and storage mediumNEC CORP·Filed 2022·Application pending·0 cites
- 2838US2016021979A1Upper Structure for a Sports ShoeMIZUNO KK·Filed 2015·Application pending·0 cites
- 2938US2023092026A1Processing device, processing method, and non-transitory storage mediumNEC CORP·Filed 2020·Application pending·0 cites
- 3037US2017161628A1Maintenance period determination device, deterioration estimation system, deterioration estimation method, and recording mediumNEC CORP·Filed 2015·Application pending·0 cites
- 3129US2015324935A1Control system for power systemTOSHIBA KK·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →