Inventor · disambiguated record
Yunfei En
Also filed as: EN YUNFEI
9 granted patents·1 pending application·20 citations·filing 2013–2018
81Inventor score
Files withFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH7FIFTH ELECTRONICS RES INST OF MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY2FIFTH ELECTRONICS RES INST OF MINI OF IND AND INFORMATION TECH1
Top patents by PatentIndex Score
10 records- 0184US10191480B2Method and system of close-loop analysis to electronic component fault problemFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2018·Granted Jan 29, 2019·5 cites·4 claims
- 0276US10732216B2Method and device of remaining life prediction for electromigration failureFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2018·Granted Aug 4, 2020·2 cites·4 claims
- 0371US9952275B2Method and device of remaining life prediction for electromigration failureFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2013·Granted Apr 24, 2018·3 cites·3 claims
- 0470US9430315B2Method and system for constructing component fault tree based on physics of failureFIFTH ELECTRONICS RES INST OF MINI OF IND AND INFORMATION TECH·Filed 2013·Granted Aug 30, 2016·6 cites·6 claims
- 0569US9329228B2Prognostic circuit of electromigration failure for integrated circuitFIFTH ELECTRONICS RES INST OF MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY·Filed 2013·Granted May 3, 2016·4 cites·9 claims
- 0641US2015168271A1Method and system for performing components fault problem close loop analysisFIFTH ELECTRONICS RES INST OF MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY·Filed 2013·Application pending·0 cites
- 0737US11231702B2Method, device and system for health monitoring of system-on-chipFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2016·Granted Jan 25, 2022·0 cites·8 claims
- 0834US10598713B2ESD failure early warning circuit for integrated circuitFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2016·Granted Mar 24, 2020·0 cites·11 claims
- 0933US10458823B2System and method for health monitoring and early warning for electronic deviceFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2016·Granted Oct 29, 2019·0 cites·8 claims
- 1031US10503578B2On-chip TDDB degradation monitoring and failure early warning circuit for SoCFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2016·Granted Dec 10, 2019·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →