Inventor · disambiguated record
Yu-Hsun Hsu
Also filed as: HSU YU-HSUN
9 granted patents·3 pending applications·4 citations·filing 2016–2025
76Inventor score
Files withMPI CORP12
Top patents by PatentIndex Score
12 records- 0188US11353501B2Wafer inspection method and wafer probing systemMPI CORP·Filed 2020·Granted Jun 7, 2022·2 cites·14 claims
- 0269US9958477B2Testing machine and operation method thereofMPI CORP·Filed 2016·Granted May 1, 2018·2 cites·14 claims
- 0365US2025237696A1Probe system, method of utilizing probe system, method of testing unpackaged semiconductor device, method of producing tested semiconductor device and tested semiconductor deviceMPI CORP·Filed 2025·Application pending·0 cites
- 0464US12196808B2Motorized chuck stage controlling methodMPI CORP·Filed 2023·Granted Jan 14, 2025·0 cites·18 claims
- 0555US2024219427A1Positioning method and probe system for performing the same, method for operating probe system, and method for utilizing probe system to produce a tested semiconductor deviceMPI CORP·Filed 2024·Application pending·0 cites
- 0654US2025147067A1Probe system for double side probing, method of operating the same and tested deviceMPI CORP·Filed 2024·Application pending·0 cites
- 0752US11287475B2Method for compensating to distance between probe tip and device under test after temperature changesMPI CORP·Filed 2020·Granted Mar 29, 2022·0 cites·7 claims
- 0849US10895587B2Wafer probe stationMPI CORP·Filed 2018·Granted Jan 19, 2021·0 cites·13 claims
- 0948US10312123B2Method for compensating probe misplacement and probe apparatusMPI CORP·Filed 2017·Granted Jun 4, 2019·0 cites·5 claims
- 1047US10976363B2Wafer inspection method and wafer probing systemMPI CORP·Filed 2018·Granted Apr 13, 2021·0 cites·24 claims
- 1145US11313883B2Probe station capable of maintaining position of probe tip upon temperature changeMPI CORP·Filed 2020·Granted Apr 26, 2022·0 cites·16 claims
- 1239US12007319B2Optical path correction subassembly, optical detection assembly, and optical detection systemMPI CORP·Filed 2022·Granted Jun 11, 2024·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →