Inventor · disambiguated record
Yuval Lamhot
Also filed as: LAMHOT YUVAL
5 granted patents·2 pending applications·1 citations·filing 2017–2023
61Inventor score
Top patents by PatentIndex Score
7 records- 0166US10699969B2Quick adjustment of metrology measurement parameters according to process variationKLA TENCOR CORP·Filed 2018·Granted Jun 30, 2020·1 cites·14 claims
- 0257US11862522B2Accuracy improvements in optical metrologyKLA TENCOR CORP·Filed 2021·Granted Jan 2, 2024·0 cites·9 claims
- 0356US11861824B1Reference image grouping in overlay metrologyKLA CORP·Filed 2023·Granted Jan 2, 2024·0 cites·25 claims
- 0455US2023259041A1Parallax method for a single-cell diffraction based measurement of misregistrationKLA CORP·Filed 2023·Application pending·0 cites
- 0547US11454894B2Systems and methods for scatterometric single-wavelength measurement of misregistration and amelioration thereofKLA CORP·Filed 2021·Granted Sep 27, 2022·0 cites·21 claims
- 0643US2018047646A1Accuracy improvements in optical metrologyKLA TENCOR CORP·Filed 2017·Application pending·0 cites
- 0741US11158548B2Overlay measurement using multiple wavelengthsKLA TENCOR CORP·Filed 2018·Granted Oct 26, 2021·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →