Inventor · disambiguated record
Yudong Lu
Also filed as: LU YUDONG
6 granted patents·9 citations·filing 2013–2024
72Inventor score
Files withFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH4FIFTH ELECTRONICS RES INST OF MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY1HEFEI INST PHYSICAL SCI CAS1
Top patents by PatentIndex Score
6 records- 0176US10732216B2Method and device of remaining life prediction for electromigration failureFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2018·Granted Aug 4, 2020·2 cites·4 claims
- 0271US9952275B2Method and device of remaining life prediction for electromigration failureFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2013·Granted Apr 24, 2018·3 cites·3 claims
- 0369US9329228B2Prognostic circuit of electromigration failure for integrated circuitFIFTH ELECTRONICS RES INST OF MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY·Filed 2013·Granted May 3, 2016·4 cites·9 claims
- 0454US12156323B2High-temperature superconducting plasma thruster system having variable temperature ranges and being applied in spaceHEFEI INST PHYSICAL SCI CAS·Filed 2024·Granted Nov 26, 2024·0 cites·7 claims
- 0533US10458823B2System and method for health monitoring and early warning for electronic deviceFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2016·Granted Oct 29, 2019·0 cites·8 claims
- 0631US10503578B2On-chip TDDB degradation monitoring and failure early warning circuit for SoCFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2016·Granted Dec 10, 2019·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →