Inventor · disambiguated record
Zhiming Jiang
Also filed as: JIANG ZHIMING
4 granted patents·9 citations·filing 2009–2023
62Inventor score
Top patents by PatentIndex Score
4 records- 0183US8711349B2High throughput thin film characterization and defect detectionKLA TENCOR CORP·Filed 2012·Granted Apr 29, 2014·8 cites·21 claims
- 0266US12429418B2Phase-resolved optical metrology for substratesAPPLIED MATERIALS INC·Filed 2023·Granted Sep 30, 2025·0 cites·20 claims
- 0359US10088413B2Spectral matching based calibrationKLA TENCOR CORP·Filed 2012·Granted Oct 2, 2018·1 cites·23 claims
- 0447US7903250B1Control by sample reflectivityKLA TENCOR CORP·Filed 2009·Granted Mar 8, 2011·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →