Inventor · name-matched record
LIU ERIC CHIH-FANG
3 granted patents·7 pending applications·0 citations·filing 2022–2025
38Inventor score
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
10 records- 0171US2026082870A1Method and apparatus for in-situ dry developmentTOKYO ELECTRON LTD·Filed 2025·Application pending·0 cites
- 0270US2026082879A1Directional sidewall deposition using directional beamTEL MFG AND ENGINEERING OF AMERICA INC·Filed 2025·Application pending·0 cites
- 0361US2026061243A1Halogen decontamination from metal-containing materials using chemical modificationTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 0461US2026082868A1Stitching defect reduction using gas cluster beamTEL MFG AND ENGINEERING OF AMERICA INC·Filed 2024·Application pending·0 cites
- 0560US2026036910A1Angled beam exposure for hardmask based modificationTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 0658US12564027B2Top-down self-alignment of vias in a semiconductor device for sub-22NM pitch metalsTOKYO ELECTRON LTD·Filed 2023·Granted Feb 24, 2026·0 cites·20 claims
- 0757US2026076155A1Conformal spacer-defined line cut structuresTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 0855US12588262B2Sacrificial gate capping layer for gate protection during source/drain contact openingTOKYO ELECTRON LTD·Filed 2022·Granted Mar 24, 2026·0 cites·19 claims
- 0955US12568677B2Method of self-aligned dielectric wall formation for forksheet applicationTOKYO ELECTRON LTD·Filed 2023·Granted Mar 3, 2026·0 cites·17 claims
- 1054US2026047405A1Pillar spacer merging patterningTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
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Identity basis: exact name match across USPTO filings. How scoring works →