US2003051911A1PendingUtilityA1
Post in ring interconnect using 3-D stacking
Priority: Sep 20, 2001Filed: Apr 5, 2002Published: Mar 20, 2003
Est. expirySep 20, 2021(expired)· nominal 20-yr term from priority
Y10T29/49155H05K 2201/09745H05K 3/462Y10T29/49126H05K 3/321H05K 2201/096H10W 90/724
35
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Claims
Abstract
A post in ring interconnect used for 3-D stacking. A retaining ring is formed on a pad on a bottom surface of a top PCB substrate to be stacked with a bottom PCB substrate. A post is formed on a pad on a top surface of the bottom PCB substrate. A conductive paste is applied on the pad on the bottom surface of the top PCB substrate and retained in a pocket partially defined by the retaining ring. The retaining ring is aligned with the post. By performing a compression step, a eutectic bond is formed between the top and bottom PCB substrates by the post and the conductive paste.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A post in ring interconnect, comprising:
two pads disposed on two adjoining surfaces of two stacked substrates, an upper one of the two pads including a peripheral retaining ring which partially defines a pocket, and a lower one of the two pads including a central post, the post being aligned with the retaining ring; and a conductive paste filled within a pocket defined by the retaining ring of the upper one of the two pads.
2 . The post in ring interconnect according to claim 1 , further comprising:
an adhesive layer accommodating the post and bonding the two adjoining surfaces of the two substrates.
3 . The post in ring interconnect according to claim 1 , wherein each of the two substrates has a distal surface including a pad formed thereon and electrically connected to the pad on the surface adjoining the other substrate by a conductive via.
4 . The post in ring interconnect according to claim 2 , wherein the adhesive is selected from the group consisting of polyester, epoxy, acrylic, phenolic/butyral, and polyimide.
5 . The post in ring interconnect according to claim 1 , wherein the two pads are formed of copper.
6 . The post in ring interconnect according to claim 1 , wherein the retaining ring is formed of copper.
7 . The post in ring interconnect according to claim 1 , wherein the post is formed of copper.
8 . The post in ring interconnect according to claim 1 , wherein the post has an outer diameter smaller than an inner diameter of the retaining ring.
9 . A post in ring interconnect process, comprising:
a) providing a top substrate having a top surface and a bottom surface which are each provided with a pad thereon; b) forming a retaining ring on a peripheral portion of the pad on the bottom surface of the top substrate; c) applying a conductive paste within the retaining ring on the pad on the bottom surface of the top substrate; d) providing a bottom substrate having a top surface and a bottom surface which are each provided with a pad thereon; e) forming a post on a central portion of the pad on the top surface of the bottom substrate; f) aligning the post and the pad on the bottom surface of the top substrate; and g) stacking the two substrates such that the conductive paste is compressed between the pad on the bottom surface of the top substrate and the post.
10 . The post in ring interconnect process according to claim 9 , wherein step (a) comprises providing a via to connect the pads on the top and bottom surfaces to each other.
11 . The post in ring interconnect process according to claim 9 , wherein step (d) comprises providing a via to connect the pads on the top and bottom surfaces to each other.
12 . The post in ring interconnect process according to claim 9 , wherein step (g) includes forming a eutectic bond of the conductive paste between the pad on the bottom surface of the top substrate and the post by controlling pressure and temperature.
13 . The post in ring interconnect process according to claim 9 , wherein step (f) comprises applying an adhesive layer to the top surface of the bottom substrate.
14 . The post in ring interconnect process according to claim 13 , wherein step (f) further comprises forming a lased hole in the adhesive layer to accommodate the post.
15 . The post in ring interconnect process according to claim 13 , wherein step (f) comprises drilling a hole in the adhesive layer to accommodate the post.
16 . The post in ring interconnect process according to claim 13 , wherein the step (g) comprises reflowing the adhesive layer via a lamination process to tightly bond the bottom surface of the top substrate to the top surface of the bottom substrate.Join the waitlist — get patent alerts
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