US2009178694A1PendingUtilityA1

Substrate processing apparatus

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Assignee: OKUDA KAZUYUKIPriority: Mar 28, 2002Filed: Mar 16, 2009Published: Jul 16, 2009
Est. expiryMar 28, 2022(expired)· nominal 20-yr term from priority
H10P 72/0604H10P 70/20H10P 50/00C23C 16/4412C23C 16/4405B08B 5/00
57
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Claims

Abstract

A substrate processing apparatus cleaning method that includes: containing a cleaning gas in a reaction tube without generating a gas flow of the cleaning gas in the reaction tube by supplying the cleaning gas into the reaction tube and by completely stopping exhaustion of the cleaning gas from the reaction tube or by exhausting the cleaning gas at an exhausting rate which substantially does not affect uniform diffusion of the cleaning gas in the reaction tube from at a point of time of a period from a predetermined point of time before the cleaning gas is supplied into the reaction tube to a point of time when several seconds are elapsed after starting of supply of the cleaning gas into the reaction tube; and thereafter exhausting the cleaning gas from the reaction tube.

Claims

exact text as granted — not AI-modified
1 . A cleaning method, comprising:
 containing a cleaning gas in a reaction tube without generating a gas flow of the cleaning gas in the reaction tube by supplying the cleaning gas into the reaction tube and by completely stopping exhaustion of the cleaning gas from the reaction tube or by exhausting the cleaning gas at an exhausting rate which substantially does not affect uniform diffusion of the cleaning gas in the reaction tube from at a point of time of a period from a predetermined point of time before the cleaning gas is supplied into the reaction tube to a point of time when several seconds are elapsed after starting of supply of the cleaning gas into said reaction tube; and   thereafter exhausting the cleaning gas from the reaction tube, wherein   the containing the cleaning gas and the exhausting the cleaning gas are repeated at least once.

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