US2012028416A1PendingUtilityA1
Film for flip chip type semiconductor back surface and its use
Est. expiryJul 29, 2030(~4 yrs left)· nominal 20-yr term from priority
H10W 72/07236H10W 72/01271H10W 72/072H10W 72/241H10W 72/07211H10W 72/07202H10W 90/724H10W 72/252H10P 72/7438H10P 72/7416H10W 74/144H10P 72/7402Y10T428/31721Y10T428/31504Y10T428/31855Y10T428/2804Y10T428/28H10P 54/00C09J 7/20
47
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Claims
Abstract
The present invention relates to a film for flip chip type semiconductor back surface, which is to be disposed on a back surface of a semiconductor element flip chip-connected onto an adherend, the film for flip chip type semiconductor back surface including an adhesive layer and a protective layer laminated on the adhesive layer, in which the protective layer is constituted of a heat-resistant resin having a glass transition temperature of 200° C. or more or a metal.
Claims
exact text as granted — not AI-modified1 . A film for flip chip type semiconductor back surface, which is to be disposed on a back surface of a semiconductor element flip chip-connected onto an adherend,
the film for flip chip type semiconductor back surface comprising an adhesive layer and a protective layer laminated on the adhesive layer, wherein the protective layer comprises a heat-resistant resin having a glass transition temperature of 200° C. or more or a metal.
2 . The film for flip chip type semiconductor back surface according to claim 1 , wherein the heat-resistant resin is at least one selected from the group consisting of a polyimide, a polyphenylene sulfide, a polysulfone, a polyether imide, a polyether ketone and a polyether ether ketone.
3 . The film for flip chip type semiconductor back surface according to claim 2 , wherein the heat-resistant resin is a polyimide.
4 . The film for flip chip type semiconductor back surface according to claim 1 , wherein the metal is at least one selected from the group consisting of aluminum, alumite, stainless steel, iron, titanium, tin and copper.
5 . The film for flip chip type semiconductor back surface according to claim 1 , wherein a surface of the protective layer facing the adhesive layer has been subjected to a surface activation treatment.
6 . The film for flip chip type semiconductor back surface according to claim 5 , wherein the surface activation treatment is at least one treatment selected from the group consisting of a plasma treatment, an ozone water treatment, an ultraviolet ozone treatment and an ion beam treatment.
7 . A dicing tape-integrated film for semiconductor back surface, which comprises:
a dicing tape comprising a base material and a pressure-sensitive adhesive layer laminated on the base material, and the film for flip chip type semiconductor back surface according to claim 1 , which is laminated on the pressure-sensitive adhesive layer so that the protective layer faces the pressure-sensitive adhesive layer.
8 . A method for producing a semiconductor device, the method comprising:
attaching a semiconductor wafer onto the film for flip chip type semiconductor back surface in the dicing tape-integrated film for semiconductor back surface according to claim 7 , dicing the semiconductor wafer to form a semiconductor element, peeling the semiconductor element together with the film for flip chip type semiconductor back surface from the pressure-sensitive adhesive layer of the dicing tape, adhering a flux to a connecting member for an adherend in the semiconductor element, and flip chip-connecting the semiconductor element onto the adherend.Cited by (0)
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