US2012090547A1PendingUtilityA1
System and method of vapor deposition
Est. expiryOct 20, 2028(~2.3 yrs left)· nominal 20-yr term from priority
H10P 76/2043H10P 76/204B05D 1/60B05D 3/02G03F 7/167
49
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Claims
Abstract
Provided is a system for vapor deposition of a coating material onto a semiconductor substrate. The system includes a chemical supply chamber, a supply nozzle operable to dispense vapor, and a heating element operable to provide heat to a substrate in-situ with the dispensing of vapor. The system may further include reaction chamber(s) and/or mixing chamber(s).
Claims
exact text as granted — not AI-modified1 . A deposition system, comprising:
a chemical supply chamber; a supply nozzle operable to dispense vapor; and a heating element operable to provide heat to a substrate in-situ with the dispensing of vapor.
2 . The system of claim 1 , further comprising:
a mixing chamber for mixing two or more chemical components provided by the chemical supply chamber.
3 . The system of claim 1 , further comprising:
a reaction chamber for reacting two or more chemical components provided by the chemical supply chamber.
4 . The system of claim 3 , wherein the reaction chamber is connected to the supply nozzle such that the reacted two or more chemicals are provided to the supply nozzle.
5 . The system of claim 1 , wherein a semiconductor substrate is positioned on the heating element while a material is vapor deposited.
6 . The system of claim 1 , further comprising:
a vaporization device positioned in the chemical supply chamber.
7 . The system of claim 1 , wherein the chemical supply chamber includes a first chamber and a second chamber.
8 . The system of claim 7 , wherein the first and second chambers include a nozzle for controlling the flow of a chemical from each of the first chamber and the second chamber.
9 . The system of claim 1 , further comprising:
a vacuum device.
10 . An apparatus, comprising:
a first material supply chamber and a second material supply chamber; a mixing chamber connected to the first and second material supply chambers; a reaction chamber connected to the mixing chamber; and a plurality of nozzles overlying a heating element operable to hold a substrate.
11 . The apparatus of claim 10 , wherein the first and second material supply chambers each include a valve that controls a flow of a material exiting the first and second material supply chambers.
12 . The apparatus of claim 10 , further comprising:
a vacuum device positioned adjacent the heating element.
13 . The apparatus of claim 12 , wherein the vacuum device is operable to remove outgassing from the substrate disposed on the heating element.
14 . The apparatus of claim 10 , wherein the substrate is a silicon wafer.
15 . The apparatus of claim 10 , wherein the plurality of nozzles dispense a photosensitive material.
16 . A system of vapor deposition, comprising:
a first material supply chamber and a second material supply chamber; a mixing chamber connected to the first and second material supply chambers; a plurality of nozzles overlying a base operable to position a substrate; and a heating element disposed in the base.
17 . The system of vapor deposition of claim 16 , wherein the heating element is operable to heat the substrate as vapor is dispensed from the plurality of nozzles.
18 . The system of vapor deposition of claim 16 , further comprising:
a vacuum device adjacent the base, wherein the vacuum device is operable to remove an evaporated chemical from the substrate positioned on the base.
19 . The system of vapor deposition of claim 16 , further comprising:
a reaction chamber connected to the mixing chamber, wherein the reaction chamber interposes the mixing chamber and the plurality of nozzles.
20 . The system of vapor deposition of claim 16 , further comprising:
a third material supply chamber connected to the mixing chamber.Cited by (0)
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