US2015275357A1PendingUtilityA1

Method of manufacturing semiconductor device

Assignee: HITACHI INT ELECTRIC INCPriority: Mar 26, 2014Filed: Apr 9, 2015Published: Oct 1, 2015
Est. expiryMar 26, 2034(~7.6 yrs left)· nominal 20-yr term from priority
H10P 14/69433H10P 14/6339H01L 21/0228H01L 21/0217C23C 16/4405C23C 16/45523C23C 16/52C23C 16/4412C23C 16/4586
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Claims

Abstract

Provided is a method of manufacturing a semiconductor device wherein a cleaning process on the inside of an exhaust buffer chamber may be performed sufficiently and satisfactorily even if gases are exhausted using the exhaust buffer chamber. The method includes: (a) processing a substrate placed on a substrate placing surface in a processing space by supplying gases onto the substrate in the processing space through a side facing the substrate placing surface while exhausting the gases from the processing space using an exhaust buffer chamber including a space surrounding an outer circumference of a side portion of the processing space; and (b) cleaning and inside of the exhaust buffer chamber by supplying a cleaning gas into the exhaust buffer chamber through a cleaning gas supply pipe communicating with the space of the exhaust buffer chamber.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A method of manufacturing a semiconductor device, comprising:
 (a) processing a substrate placed on a substrate placing surface in a processing space by supplying gases onto the substrate in the processing space through a side facing the substrate placing surface while exhausting the gases from the processing space using an exhaust buffer chamber including a space surrounding an outer circumference of a side portion of the processing space; and   (b) cleaning and inside of the exhaust buffer chamber by supplying a cleaning gas into the exhaust buffer chamber through a cleaning gas supply pipe communicating with the space of the exhaust buffer chamber.

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