US2021280527A1PendingUtilityA1
Semiconductor device
Assignee: NINGBO SEMICONDUCTOR INT CORPPriority: Nov 20, 2018Filed: May 26, 2021Published: Sep 9, 2021
Est. expiryNov 20, 2038(~12.3 yrs left)· nominal 20-yr term from priority
Inventors:Mengbin Liu
H10P 72/0614H10P 54/00H10W 46/301H10W 46/201H10W 46/00H10P 72/50B81C 2203/054B81C 99/007H01L 23/544H01L 21/67282H01L 21/78H01L 2223/54426
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Claims
Abstract
A semiconductor device is provided. The semiconductor device includes: a plurality of alignment dies, each including a diced first base substrate and at least one alignment mark on the diced first base substrate; a second base substrate; and a bonding film on the second base substrate. An alignment die of the plurality of alignment dies are attached on the bonding film on an alignment region of the second base substrate for aligning the second base substrate.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A semiconductor device, comprising:
a plurality of alignment dies, each including a diced first base substrate and at least one alignment mark on the diced first base substrate; a second base substrate; and a bonding film on the second base substrate, wherein:
an alignment die of the plurality of alignment dies are attached on the bonding film on an alignment region of the second base substrate for aligning the second base substrate.
2 . The device according to claim 1 , wherein:
the first base substrate is a semiconductor material base substrate; at least two alignment regions are arranged on the second base substrate; and two alignment regions of the at least two alignment regions are arranged on opposite sides of the second base substrate.
3 . The device according to claim 1 , wherein:
a shape of the alignment mark of the at least one alignment mark includes one or more of a cross shape, a star shape, a circle shape, an ellipse shape, a rectangle shape, and a square shape.
4 . The device according to claim 1 , wherein:
a maximum size of an alignment mark of the at least one alignment mark is in a range of approximately 0.5 mm*0.5 mm to 10 mm*10 mm.
5 . The device according to claim 1 , further including:
a chip attached on a surface of the second base substrate on which the alignment die is attached.
6 . The device according to claim 5 , wherein:
the second base substrate is aligned with the chip through the alignment die, and the chip is attached to the surface of the second base substrate through the bonding film.
7 . The device according to claim 1 , wherein:
the bonding film is made of one of a thermoplastic organic material, a thermosetting organic material, an inorganic material, a die attach film, and a dry film.
8 . The device according to claim 7 , wherein:
the inorganic material includes copper, nickel, chromium, cobalt, or a combination thereof.
9 . The device according to claim 1 , wherein:
an attach accuracy of the alignment die is smaller than or equal to about 3 μm.Join the waitlist — get patent alerts
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