Substrate processing apparatus and transfer positioning method thereof
Abstract
A substrate processing apparatus has a transfer mechanism arranged on a transfer base and configured to transfer a processing substrate between predetermined transfer positions, a mapping sensor arranged on the transfer base and configured to detect an arrangement state of a processing substrate inside a processing substrate accommodating case which accommodates a plurality of processing substrate in a shelf-like form, and a Z-axis teaching jig provided on or in the vicinity of one of the transfer positions. This substrate processing apparatus detects, by the mapping sensor, a height of the Z-axis teaching jig so as to perform teaching of Z-axis to the transfer mechanism with respect to the one of the transfer positions.
Claims
exact text as granted — not AI-modified1. A substrate processing apparatus, comprising:
a transfer mechanism arranged on a transfer base in a transfer chamber and configured to transfer a processing substrate between predetermined transfer positions;
a mapping sensor arranged on the transfer base and configured to detect an arrangement state of a processing substrate inside a processing substrate accommodating case which accommodates a plurality of processing substrates in a shelf-like form; and
a Z-axis teaching jig protruding inside said transfer chamber and provided on or in the vicinity of one of the transfer positions,
wherein said mapping sensor detects a height of said Z-axis teaching jig so as to perform teaching of Z-axis to said transfer mechanism with respect to the one of the transfer positions.
2. The substrate processing apparatus as set forth in claim 1 , further comprising:
a detecting sensor configured to detect a difference between heights of said mapping sensor and a support member supporting a processing substrate of said transfer mechanism.
3. The substrate processing apparatus as set forth in claim 1 , wherein said Z-axis teaching jig has a detachable structure.
4. The substrate processing apparatus as set forth in claim 1 ,
wherein said mapping sensor comprises a light emitting element and a light receiving element, which are arranged to oppose each other with a gap in a horizontal direction; and
wherein a height of said Z-axis teaching jig is detected by blocking of light between the light emitting element and the light receiving element by said Z-axis teaching jig when the light emitting element and the light receiving element are moved up and down.
5. The substrate processing apparatus as set forth in claim 1 ,
wherein the transfer positions are a positioning device which performs positioning of a processing substrate and a load lock chamber for transferring the processing substrate into and out of a vacuum chamber.
6. A transfer positioning method for a substrate processing apparatus which comprises a transfer mechanism arranged on a transfer base in a transfer chamber and configured to transfer a processing substrate between predetermined transfer positions, and a mapping sensor arranged on the transfer base and configured to detect an arrangement state of a processing substrate inside a processing substrate accommodating case which accommodates a plurality of processing substrate in a shelf-like form, the method comprising:
providing a Z-axis teaching jig protruding inside said transfer chamber on or in the vicinity of one of the transfer positions; and
detecting by the mapping sensor a height of the Z-axis teaching jig so as to perform teaching of Z-axis to the transfer mechanism with respect to the one of the transfer positions.
7. The transfer positioning method for the substrate processing apparatus as set forth in claim 6 , further comprising:
detecting a difference between heights of the mapping sensor and a support member supporting a processing substrate of the transfer mechanism.
8. The transfer positioning method for the substrate processing apparatus as set forth in claim 6 ,
wherein the Z-axis teaching jig has a detachable structure, and the Z-axis teaching jig is attached when Z-axis teaching is performed and removed after the Z-axis teaching is completed.Cited by (0)
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