USD350490SExpiredUtility

Semiconductor wafer testing apparatus

Assignee: TOKYO ELECTRON LTDPriority: Oct 8, 1992Filed: Apr 7, 1993Granted: Sep 13, 1994

Est. expiryOct 8, 2012(expired)· nominal 20-yr term from priority

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exact text as granted — not AI-modified

The ornamental design for semiconductor wafer testing apparatus, as shown and described.

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