Inventor · disambiguated record
Itaru Takao
Also filed as: TAKAO ITARU
7 granted patents·308 citations·filing 1988–1993
87Inventor score
Top patents by PatentIndex Score
7 records- 0191US5410259AProbing device setting a probe card parallelTEL YAMANISHI KK·Filed 1993·Granted Apr 25, 1995·229 cites·16 claims
- 0260US4955590APlate-like member receiving apparatusTOKYO ELECTRON LTD·Filed 1988·Granted Sep 11, 1990·26 cites·5 claims
- 0356US5065495AMethod for holding a plate-like memberTOKYO ELECTRON LTD·Filed 1990·Granted Nov 19, 1991·27 cites·2 claims
- 0454USD350490SSemiconductor wafer testing apparatusTOKYO ELECTRON LTD·Filed 1993·Granted Sep 13, 1994·8 cites·1 claims
- 0545US5086270AProbe apparatusTOKYO ELECTRON LTD·Filed 1990·Granted Feb 4, 1992·12 cites·8 claims
- 0636USD323628SSemiconductor wafer measuring instrumentTOKYO ELECTRON LTD·Filed 1989·Granted Feb 4, 1992·2 cites·1 claims
- 0732US4941800ATransfer apparatus for plate-like memberTOKYO ELECTRON LTD·Filed 1988·Granted Jul 17, 1990·4 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →