USD420022SExpiredUtility

Electrostatic chuck with improved spacing and charge migration reduction mask

86
Assignee: APPLIED MATERIALS INCPriority: Dec 24, 1997Filed: Dec 24, 1997Granted: Feb 1, 2000
Est. expiryDec 24, 2017(expired)· nominal 20-yr term from priority
86
PatentIndex Score
31
Cited by
1
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for an electrostatic chuck with improved spacing and charge migration reduction mask, as shown and described.

Cited by (0)

No later patents cite this yet.

References (0)

No backward citations on record.