USD420022SExpiredUtility
Electrostatic chuck with improved spacing and charge migration reduction mask
Est. expiryDec 24, 2017(expired)· nominal 20-yr term from priority
86
PatentIndex Score
31
Cited by
1
References
1
Claims
Claims
exact text as granted — not AI-modifiedThe ornamental design for an electrostatic chuck with improved spacing and charge migration reduction mask, as shown and described.
Cited by (0)
No later patents cite this yet.
References (0)
No backward citations on record.