Inventor
NAGASAKA MUNETOSHI
JP14 patents
⚠️ This page may combine multiple inventors who share the name “NAGASAKA MUNETOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOKYO ELECTRON LTD
12 patentsUSD609652SFeb 9, 2010
Wafer attracting plate
TOKYO ELECTRON LTD567 citations97
USD589912SApr 7, 2009
Wafer holding member
TOKYO ELECTRON LTD32 citations91
USD589474SMar 31, 2009
Wafer holding member
TOKYO ELECTRON LTD34 citations91
US5604443AFeb 18, 1997
Probe test apparatus
TOKYO ELECTRON LTD45 citations86
US9638719B2May 2, 2017
Probe device having cleaning mechanism for cleaning connection conductor
TOKYO ELECTRON LTD2 citations70
US9759762B2Sep 12, 2017
Probe device
TOKYO ELECTRON LTD2 citations69
US7541801B2Jun 2, 2009
Probe card transfer assist apparatus, and inspection equipment and method using same
TOKYO ELECTRON LTD6 citations61
US7528620B2May 5, 2009
Probe card transfer assist apparatus and inspection equipment using same
TOKYO ELECTRON LTD3 citations61
USD612879SMar 30, 2010
Semiconductor wafer inspection apparatus
TOKYO ELECTRON LTD1 citations51
USD383683SSep 16, 1997
Wafer prober
TOKYO ELECTRON LTD1 citations50
US9523711B2Dec 20, 2016
Probe apparatus and wafer mounting table for probe apparatus
TOKYO ELECTRON LTD0 citations41
US9261553B2Feb 16, 2016
Probe apparatus
TOKYO ELECTRON LTD0 citations39