Inventor · disambiguated record
Meng-Jun Wang
Also filed as: WANG MENG · WANG MENG-JUN
13 granted patents·7 pending applications·25 citations·filing 2006–2024
86Inventor score
Files withUNITED MICROELECTRONICS CORP7UNIV GUANGDONG TECHNOLOGY3WANG MENG-JUN3HUANG CHUN-JEN1LIN LI-TE S1
Top patents by PatentIndex Score
20 records- 0192US10727397B1Magnetoresistive random access memory cellUNITED MICROELECTRONICS CORP·Filed 2019·Granted Jul 28, 2020·5 cites·16 claims
- 0281US8563410B2End-cut first approach for critical dimension controlLIN LI-TE S·Filed 2009·Granted Oct 22, 2013·9 cites·18 claims
- 0376US7592265B2Method of trimming a hard mask layer, method for fabricating a gate in a MOS transistor, and a stack for fabricating a gate in a MOS transistorUNITED MICROELECTRONICS CORP·Filed 2007·Granted Sep 22, 2009·6 cites·20 claims
- 0473US10847709B1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2019·Granted Nov 24, 2020·1 cites·7 claims
- 0570US10239167B2Stiffness-frequency adjustable XY micromotion stage based on stress stiffeningUNIV GUANGDONG TECHNOLOGY·Filed 2014·Granted Mar 26, 2019·2 cites·11 claims
- 0667US10636744B2Memory device including alignment mark trenchUNITED MICROELECTRONICS CORP·Filed 2018·Granted Apr 28, 2020·2 cites·20 claims
- 0766US11283007B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2020·Granted Mar 22, 2022·0 cites·11 claims
- 0856US12023546B2Dental applianceWUXI EA MEDICAL INSTRUMENTS TECH LIMITED·Filed 2019·Granted Jul 2, 2024·0 cites·8 claims
- 0956US2025344469A1Semiconductor structures and fabricating methods thereofYANGTZE MEMORY TECH CO LTD·Filed 2024·Application pending·0 cites
- 1054US9196491B2End-cut first approach for critical dimension controlTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Nov 24, 2015·0 cites·20 claims
- 1148US9766421B2Method for compensating for wavelength shift in wavelength selective switch, and device thereforYANG LIU·Filed 2012·Granted Sep 19, 2017·0 cites·11 claims
- 1247US9945698B2Macro-micro composite grating ruler measuring system and measuring method using same comprising a macro-scale reading module, a micro-scale reading module and a measuring reference lineUNIV GUANGDONG TECHNOLOGY·Filed 2014·Granted Apr 17, 2018·0 cites·10 claims
- 1347US2023409280A1Techniques for Off-Net Synchrony Group FormationSONOS INC·Filed 2023·Application pending·0 cites
- 1446US2016350462A1Method of planning asymmetric variable acceleration based on non-linear finite element dynamic response simulationUNIV GUANGDONG TECHNOLOGY·Filed 2014·Application pending·0 cites
- 1545US2009206403A1Method of trimming a hard mask layer, method for fabricating a gate in a mos transistor, and a stack for fabricating a gate in a mos transistorWANG MENG-JUN·Filed 2009·Application pending·0 cites
- 1644US10438893B2Metal interconnect structure and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2017·Granted Oct 8, 2019·0 cites·16 claims
- 1743US8071487B2Patterning method using stacked structureWANG MENG-JUN·Filed 2006·Granted Dec 6, 2011·0 cites·17 claims
- 1841US2011254142A1Stacked structureWANG MENG-JUN·Filed 2011·Application pending·0 cites
- 1940US2008102643A1Patterning methodUNITED MICROELECTRONICS CORP·Filed 2006·Application pending·0 cites
- 2038US2007249165A1Dual damascene processHUANG CHUN-JEN·Filed 2006·Application pending·0 cites
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