Inventor
PARK JUNGRAE
US28 patents
⚠️ This page may combine multiple inventors who share the name “PARK JUNGRAE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS INC
18 patentsUS8991329B1Mar 31, 2015
Wafer coating
APPLIED MATERIALS INC19 citations93
US9245803B1Jan 26, 2016
Hybrid wafer dicing approach using a bessel beam shaper laser scribing process and plasma etch process
APPLIED MATERIALS INC7 citations84
US10903121B1Jan 26, 2021
Hybrid wafer dicing approach using a uniform rotating beam laser scribing process and plasma etch process
APPLIED MATERIALS INC4 citations73
US10363629B2Jul 30, 2019
Mitigation of particle contamination for wafer dicing processes
APPLIED MATERIALS INC3 citations73
US9972575B2May 15, 2018
Hybrid wafer dicing approach using a split beam laser scribing process and plasma etch process
APPLIED MATERIALS INC3 citations73
US9852997B2Dec 26, 2017
Hybrid wafer dicing approach using a rotating beam laser scribing process and plasma etch process
APPLIED MATERIALS INC4 citations73
US9130030B1Sep 8, 2015
Baking tool for improved wafer coating process
APPLIED MATERIALS INC5 citations73
US11217536B2Jan 4, 2022
Hybrid wafer dicing approach using a split beam laser scribing process and plasma etch process
APPLIED MATERIALS INC0 citations63
US9105710B2Aug 11, 2015
Wafer dicing method for improving die packaging quality
APPLIED MATERIALS INC2 citations63
US11854888B2Dec 26, 2023
Laser scribing trench opening control in wafer dicing using hybrid laser scribing and plasma etch approach
APPLIED MATERIALS INC0 citations60
US12437999B2Oct 7, 2025
Methods and apparatus for mask patterning debris removal
APPLIED MATERIALS INC0 citations58
US12068159B2Aug 20, 2024
Methods and apparatus for mask patterning debris removal
APPLIED MATERIALS INC0 citations58
US11011424B2May 18, 2021
Hybrid wafer dicing approach using a spatially multi-focused laser beam laser scribing process and plasma etch process
APPLIED MATERIALS INC0 citations58
US11901232B2Feb 13, 2024
Automatic kerf offset mapping and correction system for laser dicing
APPLIED MATERIALS INC0 citations57
US10661383B2May 26, 2020
Mitigation of particle contamination for wafer dicing processes
APPLIED MATERIALS INC0 citations52
US9768014B2Sep 19, 2017
Wafer coating
APPLIED MATERIALS INC0 citations52
US11342226B2May 24, 2022
Hybrid wafer dicing approach using an actively-focused laser beam laser scribing process and plasma etch process
APPLIED MATERIALS INC0 citations51
US10535561B2Jan 14, 2020
Hybrid wafer dicing approach using a multiple pass laser scribing process and plasma etch process
APPLIED MATERIALS INC0 citations42
LEI WEI-SHENG
5 patentsUS9601375B2Mar 21, 2017
UV-cure pre-treatment of carrier film for wafer dicing using hybrid laser scribing and plasma etch approach
LEI WEI-SHENG9 citations84
US9355907B1May 31, 2016
Hybrid wafer dicing approach using a line shaped laser beam profile laser scribing process and plasma etch process
LEI WEI-SHENG14 citations84
US9349648B2May 24, 2016
Hybrid wafer dicing approach using a rectangular shaped two-dimensional top hat laser beam profile or a linear shaped one-dimensional top hat laser beam profile laser scribing process and plasma etch process
LEI WEI-SHENG7 citations84
US9012305B1Apr 21, 2015
Wafer dicing using hybrid laser scribing and plasma etch approach with intermediate non-reactive post mask-opening clean
LEI WEI-SHENG12 citations84
US9299611B2Mar 29, 2016
Method of wafer dicing using hybrid laser scribing and plasma etch approach with mask plasma treatment for improved mask etch resistance
LEI WEI-SHENG1 citations52
PARK JUNGRAE
3 patentsUS9196536B1Nov 24, 2015
Hybrid wafer dicing approach using a phase modulated laser beam profile laser scribing process and plasma etch process
PARK JUNGRAE6 citations71
US9177861B1Nov 3, 2015
Hybrid wafer dicing approach using laser scribing process based on an elliptical laser beam profile or a spatio-temporal controlled laser beam profile
PARK JUNGRAE5 citations71
US9281244B1Mar 8, 2016
Hybrid wafer dicing approach using an adaptive optics-controlled laser scribing process and plasma etch process
PARK JUNGRAE1 citations51