Inventor
MORITA SHINYA
JP100 patents
⚠️ This page may combine multiple inventors who share the name “MORITA SHINYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI INT ELECTRIC INC
12 patentsUSD739832SSep 29, 2015
Reaction tube
HITACHI INT ELECTRIC INC34 citations94
USD725055SMar 24, 2015
Reaction tube
HITACHI INT ELECTRIC INC36 citations94
USD719114SDec 9, 2014
Reaction tube
HITACHI INT ELECTRIC INC19 citations92
USD711843SAug 26, 2014
Reaction tube
HITACHI INT ELECTRIC INC30 citations92
US8043431B2Oct 25, 2011
Substrate processing apparatus and method for manufacturing a semiconductor device
HITACHI INT ELECTRIC INC16 citations91
USD773609SDec 6, 2016
Return nozzle
HITACHI INT ELECTRIC INC10 citations84
USD771772SNov 15, 2016
Return nozzle
HITACHI INT ELECTRIC INC8 citations84
USD720707SJan 6, 2015
Reaction tube
HITACHI INT ELECTRIC INC14 citations84
US7795157B2Sep 14, 2010
Substrate treatment device and manufacturing method of semiconductor device
HITACHI INT ELECTRIC INC9 citations82
USD791091SJul 4, 2017
Pattern wafer
HITACHI INT ELECTRIC INC5 citations73
USD789311SJun 13, 2017
Pattern wafer
HITACHI INT ELECTRIC INC4 citations70
USD771543SNov 15, 2016
Return nozzle
HITACHI INT ELECTRIC INC2 citations63
SONY CORP
9 patentsUS5969897AOct 19, 1999
Data recording apparatus and method
SONY CORP24 citations93
US7463105B2Dec 9, 2008
Microresonator, band-pass filter, semiconductor device, and communication apparatus
SONY CORP12 citations84
US5825572AOct 20, 1998
Apparatus and method for recording data according to a measured transfer speed
SONY CORP11 citations74
US5612827AMar 18, 1997
Data recorder having self-diagnostic function using magnetic tape
SONY CORP11 citations74
US5469563ANov 21, 1995
Method and control apparatus for self diagnosis
SONY CORP17 citations74
US10287160B2May 14, 2019
Electrostatic device
SONY CORP2 citations73
US6222693B1Apr 24, 2001
Re-recording/re-producing device for magnetic tape and head cleaning
SONY CORP8 citations73
US9640357B2May 2, 2017
Electronic device and electronic apparatus having a fuse that is fractured by external forces
SONY CORP2 citations71
US7541895B2Jun 2, 2009
Electro mechanical device and manufacturing method thereof, and resonator and manufacturing method thereof
SONY CORP6 citations68
MORITA SHINYA
6 patentsUS8264291B2Sep 11, 2012
Resonator and a method of manufacturing the same, and oscillator and electronic apparatus including the same
MORITA SHINYA269 citations99
US8529701B2Sep 10, 2013
Substrate processing apparatus
MORITA SHINYA464 citations96
US9184298B2Nov 10, 2015
Interconnect structure and sputtering target
MORITA SHINYA13 citations83
US8851886B2Oct 7, 2014
Substrate processing apparatus and method of manufacturing semiconductor device
MORITA SHINYA11 citations83
US8076615B2Dec 13, 2011
Substrate processing apparatus and method of manufacturing semiconductor device
MORITA SHINYA13 citations81
US10468535B2Nov 5, 2019
Oxide for semiconductor layer of thin film transistor, sputtering target, and thin film transistor
MORITA SHINYA4 citations71
KOBE STEEL LTD
6 patentsUS9202926B2Dec 1, 2015
Thin film transistor
KOBE STEEL LTD9 citations82
US9362313B2Jun 7, 2016
Thin film transistor and display device
KOBE STEEL LTD6 citations73
US9318507B2Apr 19, 2016
Thin film transistor and display device
KOBE STEEL LTD4 citations73
US10562087B2Feb 18, 2020
Door beam
KOBE STEEL LTD4 citations72
US9343586B2May 17, 2016
Thin film transistor
KOBE STEEL LTD5 citations72
US9324882B2Apr 26, 2016
Thin film transistor
KOBE STEEL LTD4 citations72
RIKEN
5 patentsUS6537138B2Mar 25, 2003
Method of grinding an axially asymmetric aspherical mirror
RIKEN111 citations95
US7106528B2Sep 12, 2006
Method and apparatus for manufacturing large double-sided curved Fresnel lens
RIKEN42 citations92
US6539642B1Apr 1, 2003
Probe type shape measuring sensor, and NC processing equipment and shape measuring method using the sensor
RIKEN44 citations92
US7685733B2Mar 30, 2010
Micro force measurement device, micro force measurement method, and micro surface shape measurement probe
RIKEN32 citations89
US6444994B1Sep 3, 2002
Apparatus and method for processing the components of a neutron lens
RIKEN16 citations84
KOKUSAI ELECTRIC CORP
4 patentsUSD862404SOct 8, 2019
Sealing material ring for a semiconductor manufacturing apparatus
KOKUSAI ELECTRIC CORP33 citations94
USD901564SNov 10, 2020
Gas inlet attachment for wafer processing apparatus
KOKUSAI ELECTRIC CORP10 citations84
US11685993B2Jun 27, 2023
Method of cleaning reaction tube, method of manufacturing semiconductor device, and substrate processing apparatus
KOKUSAI ELECTRIC CORP3 citations73
USD981972SMar 28, 2023
Adiabatic plate for substrate processing appratus
KOKUSAI ELECTRIC CORP3 citations73
TAKESHITA MITSUNORI
1 patentKOKUSAI ELECTRIC CO LTD
1 patentOZAKI TAKASHI
1 patentKAWAKAMI NOBUYUKI
1 patentSAMSUNG DISPLAY CO LTD
1 patentIHI CORP
1 patentSONY SEMICONDUCTOR SOLUTIONS CORP
1 patentMIKI AYA
1 patentShowing the top 50 of 100 patents by PatentIndex Score.