P

Inventor

MOCHIZUKI JUN

JP58 patents
⚠️ This page may combine multiple inventors who share the name “MOCHIZUKI JUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOKYO ELECTRON LTD

17 patents
US7474110B2Jan 6, 2009

Probe card

TOKYO ELECTRON LTD18 citations92
US5926028AJul 20, 1999

Probe card having separated upper and lower probe needle groups

TOKYO ELECTRON LTD47 citations92
US7498827B2Mar 3, 2009

Probe card

TOKYO ELECTRON LTD10 citations83
US11035883B2Jun 15, 2021

Intermediate connection member and inspection apparatus

TOKYO ELECTRON LTD5 citations73
USRE42637EAug 23, 2011

Probe card

TOKYO ELECTRON LTD5 citations73
US8362792B2Jan 29, 2013

Manufacturing method of probe card and the probe card

TOKYO ELECTRON LTD2 citations63
US11563297B2Jan 24, 2023

Pogo block within the intermediate connection member of an inspection system

TOKYO ELECTRON LTD0 citations62
US11408926B2Aug 9, 2022

Electrical connecting device, inspection apparatus, and method for electrical connection between contact target and contact member

TOKYO ELECTRON LTD0 citations62
US11307223B2Apr 19, 2022

Inspection device and method of controlling temperature of probe card

TOKYO ELECTRON LTD0 citations62
US7750655B2Jul 6, 2010

Multilayer substrate and probe card

TOKYO ELECTRON LTD2 citations62
US11561240B2Jan 24, 2023

Intermediate connecting member and inspection apparatus

TOKYO ELECTRON LTD0 citations52
US7692435B2Apr 6, 2010

Probe card and probe device for inspection of a semiconductor device

TOKYO ELECTRON LTD0 citations52
US9863977B2Jan 9, 2018

Method of contacting substrate with probe card

TOKYO ELECTRON LTD1 citations51
US9140726B2Sep 22, 2015

Support body for contact terminals and probe card

TOKYO ELECTRON LTD0 citations51
US12359982B2Jul 15, 2025

Mounting table, inspection device, and temperature calibration method

TOKYO ELECTRON LTD0 citations48
US11378610B2Jul 5, 2022

Inspection system and temperature measuring method for inspection system

TOKYO ELECTRON LTD0 citations48
US11346861B2May 31, 2022

Contact accuracy assurance method, contact accuracy assurance mechanism, and inspection apparatus

TOKYO ELECTRON LTD0 citations48

CANON KK

14 patents
US6990300B2Jan 24, 2006

Image forming apparatus with bias and integral current control features

CANON KK29 citations93
US6904245B2Jun 7, 2005

Image forming apparatus with transfer bias controlled by a detected test pattern

CANON KK26 citations93
US7664444B2Feb 16, 2010

Image forming apparatus with multiple image forming modes

CANON KK13 citations84
US7130550B2Oct 31, 2006

Image forming apparatus featuring a changeable mixing ratio of deep and pale color toners

CANON KK12 citations84
US6804481B2Oct 12, 2004

Image forming apparatus

CANON KK13 citations84
US7130568B2Oct 31, 2006

Image forming apparatus which presents faulty image when toner image on image bearing member is transferred to transferring medium

CANON KK10 citations74
US6477340B2Nov 5, 2002

Image forming apparatus having emergency stop image processing features

CANON KK13 citations74
US6395387B1May 28, 2002

Transparent film for electrophotography and toner image forming method using same

CANON KK8 citations74
US9146507B2Sep 29, 2015

Image forming apparatus with voltage adjustment

CANON KK3 citations63
US7860420B2Dec 28, 2010

Cleaner-less image forming apparatus

CANON KK3 citations63
US7848671B2Dec 7, 2010

Image forming apparatus with multiple image forming portions and image transfers

CANON KK5 citations63
US7460811B2Dec 2, 2008

Image forming apparatus

CANON KK4 citations63
US8977149B2Mar 10, 2015

Image forming apparatus

CANON KK1 citations52
US9170546B2Oct 27, 2015

Image forming apparatus for performing an adjustment based on detected image data

CANON KK0 citations42

MOCHIZUKI JUN

6 patents

HORIZON INT INC

5 patents

HITACHI LTD

4 patents

HORIZON INC

2 patents

TAKASE SHINICHIRO

1 patent

KASHIBA MASAYUKI

1 patent

Showing the top 50 of 58 patents by PatentIndex Score.