Inventor
RANADE PUSHKAR
US78 patents
⚠️ This page may combine multiple inventors who share the name “RANADE PUSHKAR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MIE FUJITSU SEMICONDUCTOR LTD
12 patentsUS9093550B1Jul 28, 2015
Integrated circuits having a plurality of high-K metal gate FETs with various combinations of channel foundation structure and gate stack structure and methods of making same
MIE FUJITSU SEMICONDUCTOR LTD20 citations91
US9478571B1Oct 25, 2016
Buried channel deeply depleted channel transistor
MIE FUJITSU SEMICONDUCTOR LTD10 citations84
US9196727B2Nov 24, 2015
High uniformity screen and epitaxial layers for CMOS devices
MIE FUJITSU SEMICONDUCTOR LTD8 citations84
US9111785B2Aug 18, 2015
Semiconductor structure with improved channel stack and method for fabrication thereof
MIE FUJITSU SEMICONDUCTOR LTD7 citations84
US9922977B2Mar 20, 2018
Transistor with threshold voltage set notch and method of fabrication thereof
MIE FUJITSU SEMICONDUCTOR LTD6 citations83
US9299698B2Mar 29, 2016
Semiconductor structure with multiple transistors having various threshold voltages
MIE FUJITSU SEMICONDUCTOR LTD7 citations83
US9112057B1Aug 18, 2015
Semiconductor devices with dopant migration suppression and method of fabrication thereof
MIE FUJITSU SEMICONDUCTOR LTD17 citations83
US9496261B2Nov 15, 2016
Low power semiconductor transistor structure and method of fabrication thereof
MIE FUJITSU SEMICONDUCTOR LTD10 citations81
US9865596B2Jan 9, 2018
Low power semiconductor transistor structure and method of fabrication thereof
MIE FUJITSU SEMICONDUCTOR LTD2 citations73
US9786703B2Oct 10, 2017
Buried channel deeply depleted channel transistor
MIE FUJITSU SEMICONDUCTOR LTD2 citations73
US9368624B2Jun 14, 2016
Method for fabricating a transistor with reduced junction leakage current
MIE FUJITSU SEMICONDUCTOR LTD3 citations73
US9281248B1Mar 8, 2016
CMOS gate stack structures and processes
MIE FUJITSU SEMICONDUCTOR LTD1 citations63
INTEL CORP
9 patentsUS7691752B2Apr 6, 2010
Methods of forming improved EPI fill on narrow isolation bounded source/drain regions and structures formed thereby
INTEL CORP45 citations89
US9847420B2Dec 19, 2017
Active regions with compatible dielectric layers
INTEL CORP1 citations63
US12588485B2Mar 24, 2026
Integrated circuit structures having airgaps for backside signal routing or power delivery
INTEL CORP0 citations62
US12572299B2Mar 10, 2026
Method and apparatus to implement an integrated circuit including both dynamic random-access memory (DRAM) and static random-access memory (SRAM)
INTEL CORP0 citations62
US12512365B2Dec 30, 2025
Integrated circuit interconnect structures with a metal chalcogenide liner
INTEL CORP0 citations62
US12488832B2Dec 2, 2025
Embedded dynamic random-access memory (eDRAM) to operate based on data access characteristics
INTEL CORP0 citations62
US12471362B2Nov 11, 2025
Integrated circuit structures having ultra-high conductivity global routing
INTEL CORP0 citations62
US12562215B2Feb 24, 2026
Providing orthogonal subarrays in a dynamic random access memory
INTEL CORP0 citations61
US12498876B2Dec 16, 2025
Performing distributed processing using distributed memory
INTEL CORP0 citations61
SUVOLTA INC
6 patentsUS8877619B1Nov 4, 2014
Process for manufacture of integrated circuits with different channel doping transistor architectures and devices therefrom
SUVOLTA INC12 citations82
US8937005B2Jan 20, 2015
Reducing or eliminating pre-amorphization in transistor manufacture
SUVOLTA INC4 citations81
US9041126B2May 26, 2015
Deeply depleted MOS transistors having a screening layer and methods thereof
SUVOLTA INC6 citations73
US9006843B2Apr 14, 2015
Source/drain extension control for advanced transistors
SUVOLTA INC2 citations63
US8686511B2Apr 1, 2014
Source/drain extension control for advanced transistors
SUVOLTA INC3 citations63
US8653604B1Feb 18, 2014
Multiple transistor types formed in a common epitaxial layer by differential out-diffusion from a doped underlayer
SUVOLTA INC3 citations63
SHIFREN LUCIAN
5 patentsUS8748986B1Jun 10, 2014
Electronic device with controlled threshold voltage
SHIFREN LUCIAN25 citations92
US8421162B2Apr 16, 2013
Advanced transistors with punch through suppression
SHIFREN LUCIAN30 citations92
US8530286B2Sep 10, 2013
Low power semiconductor transistor structure and method of fabrication thereof
SHIFREN LUCIAN6 citations84
US8569128B2Oct 29, 2013
Semiconductor structure and method of fabrication thereof with mixed metal types
SHIFREN LUCIAN8 citations83
US9406567B1Aug 2, 2016
Method for fabricating multiple transistor devices on a substrate with varying threshold voltages
SHIFREN LUCIAN3 citations73
RANADE PUSHKAR
4 patentsUS7598142B2Oct 6, 2009
CMOS device with dual-epi channels and self-aligned contacts
RANADE PUSHKAR137 citations94
US8404551B2Mar 26, 2013
Source/drain extension control for advanced transistors
RANADE PUSHKAR17 citations92
US8563384B2Oct 22, 2013
Source/drain extension control for advanced transistors
RANADE PUSHKAR9 citations83
US9646822B2May 9, 2017
Active regions with compatible dielectric layers
RANADE PUSHKAR2 citations73
SCUDDER LANCE
3 patentsUS8569156B1Oct 29, 2013
Reducing or eliminating pre-amorphization in transistor manufacture
SCUDDER LANCE25 citations90
US8999861B1Apr 7, 2015
Semiconductor structure with substitutional boron and method for fabrication thereof
SCUDDER LANCE5 citations71
US8778786B1Jul 15, 2014
Method for substrate preservation during transistor fabrication
SCUDDER LANCE4 citations71
THOMPSON SCOTT E
3 patentsUS8883600B1Nov 11, 2014
Transistor having reduced junction leakage and methods of forming thereof
THOMPSON SCOTT E5 citations84
US8796048B1Aug 5, 2014
Monitoring and measurement of thin film layers
THOMPSON SCOTT E16 citations83
US8614128B1Dec 24, 2013
CMOS structures and processes based on selective thinning
THOMPSON SCOTT E10 citations83
UNIV CALIFORNIA
2 patentsHOFFMANN THOMAS
2 patentsIBM
1 patentARGHAVANI REZA
1 patentWANG LINGQUAN
1 patentGREGORY PAUL E
1 patentShowing the top 50 of 78 patents by PatentIndex Score.