Inventor · disambiguated record
Andreas Goebel
Also filed as: GOEBEL ANDREAS
43 granted patents·12 pending applications·217 citations·filing 1993–2025
98Inventor score
Top patents by PatentIndex Score
55 records- 0198US9620611B1MIS contact structure with metal oxide conductorACORN TECH INC·Filed 2016·Granted Apr 11, 2017·16 cites·19 claims
- 0297US11728624B2Tensile strained semiconductor photon emission and detection devices and integrated photonics systemACORN SEMI LLC·Filed 2022·Granted Aug 15, 2023·2 cites·50 claims
- 0397US11462643B2Nanowire transistor with source and drain induced by electrical contacts with negative Schottky barrier heightACORN SEMI LLC·Filed 2020·Granted Oct 4, 2022·3 cites·21 claims
- 0497US9270083B2Tensile strained semiconductor photon emission and detection devices and integrated photonics systemACORN TECH INC·Filed 2015·Granted Feb 23, 2016·10 cites·30 claims
- 0596US9036672B2Tensile strained semiconductor photon emission and detection devices and integrated photonics systemACORN TECH INC·Filed 2014·Granted May 19, 2015·12 cites·20 claims
- 0696US8731017B2Tensile strained semiconductor photon emission and detection devices and integrated photonics systemCLIFTON PAUL A·Filed 2011·Granted May 20, 2014·26 cites·27 claims
- 0795US10833199B2Nanowire transistor with source and drain induced by electrical contacts with negative Schottky barrier heightACORN SEMI LLC·Filed 2019·Granted Nov 10, 2020·7 cites·34 claims
- 0895US10170627B2Nanowire transistor with source and drain induced by electrical contacts with negative schottky barrier heightACORN TECH INC·Filed 2017·Granted Jan 1, 2019·9 cites·26 claims
- 0995US9362376B2Metal contacts to group IV semiconductors by inserting interfacial atomic monolayersACORN TECH INC·Filed 2012·Granted Jun 7, 2016·13 cites·26 claims
- 1093US10193307B2Tensile strained semiconductor photon emission and detection devices and integrated photonics systemACORN TECH INC·Filed 2017·Granted Jan 29, 2019·4 cites·21 claims
- 1193US2025366078A1Relating to soi wafers and devices with buried stressorsACORN SEMI LLC·Filed 2025·Application pending·0 cites
- 1292US10505047B2Nanowire transistor with source and drain induced by electrical contacts with negative Schottky barrier heightACORN TECH INC·Filed 2018·Granted Dec 10, 2019·5 cites·20 claims
- 1391US10147798B2MIS contact structure with metal oxide conductorACORN TECH INC·Filed 2017·Granted Dec 4, 2018·4 cites·20 claims
- 1491US7760980B2Ridge technique for fabricating an optical detector and an optical waveguideAPPLIED MATERIALS INC·Filed 2006·Granted Jul 20, 2010·17 cites·21 claims
- 1589US12477776B2Nanowire transistor with source and drain induced by electrical contacts with negative Schottky barrier heightACORN SEMI LLC·Filed 2024·Granted Nov 18, 2025·0 cites·38 claims
- 1688US2025275218A1Metal contacts to group iv semiconductors by inserting interfacial atomic monolayersACORN SEMI LLC·Filed 2025·Application pending·0 cites
- 1787US12336263B2Metal contacts to group IV semiconductors by inserting interfacial atomic monolayersACORN SEMI LLC·Filed 2023·Granted Jun 17, 2025·0 cites·14 claims
- 1887US2023344200A1Tensile strained semiconductor photon emission and detection devices and integrated photonics systemACORN SEMI LLC·Filed 2023·Application pending·0 cites
- 1986US12402365B2SOI wafers and devices with buried stressorsACORN SEMI LLC·Filed 2023·Granted Aug 26, 2025·0 cites·29 claims
- 2086US10833194B2SOI wafers and devices with buried stressorACORN TECH INC·Filed 2019·Granted Nov 10, 2020·2 cites·5 claims
- 2185US11843040B2MIS contact structure with metal oxide conductorACORN SEMI LLC·Filed 2020·Granted Dec 12, 2023·1 cites·18 claims
- 2285US11804533B2Metal contacts to group IV semiconductors by inserting interfacial atomic monolayersACORN SEMI LLC·Filed 2023·Granted Oct 31, 2023·0 cites·8 claims
- 2385US8212336B2Field effect transistor source or drain with a multi-facet surfaceGOEBEL ANDREAS·Filed 2009·Granted Jul 3, 2012·21 cites·32 claims
- 2484US2024072150A1Mis contact structure with metal oxide conductorACORN SEMI LLC·Filed 2023·Application pending·0 cites
- 2582US10872964B2MIS contact structure with metal oxide conductorACORN SEMI LLC·Filed 2020·Granted Dec 22, 2020·1 cites·30 claims
- 2681US12034078B2Nanowire transistor with source and drain induced by electrical contacts with negative Schottky barrier heightACORN SEMI LLC·Filed 2022·Granted Jul 9, 2024·0 cites·8 claims
- 2780US11791411B2Relating to SOI wafers and devices with buried stressorsACORN SEMI LLC·Filed 2022·Granted Oct 17, 2023·0 cites·20 claims
- 2879US7505647B2Method and apparatus for demultiplexing optical signals in a passive optical networkAPPLIED MATERIALS INC·Filed 2007·Granted Mar 17, 2009·7 cites·25 claims
- 2979US6888639B2In-situ film thickness measurement using spectral interference at grazing incidenceAPPLIED MATERIALS INC·Filed 2001·Granted May 3, 2005·21 cites·24 claims
- 3079US2025158362A1Tensile strained semiconductor photon emission and detection devices and integrated photonics systemACORN SEMI LLC·Filed 2025·Application pending·0 cites
- 3179US2025167523A1Tensile strained semiconductor photon emission and detection devices and integrated photonics systemACORN SEMI LLC·Filed 2025·Application pending·0 cites
- 3277US11610974B2Metal contacts to group IV semiconductors by inserting interfacial atomic monolayersACORN SEMI LLC·Filed 2020·Granted Mar 21, 2023·0 cites·20 claims
- 3377US10727647B2Tensile strained semiconductor photon emission and detection devices and integrated photonics systemACORN TECH INC·Filed 2018·Granted Jul 28, 2020·0 cites·15 claims
- 3477US7985689B2Patterning 3D features in a substrateAPPLIED MATRIALS INC·Filed 2007·Granted Jul 26, 2011·6 cites·23 claims
- 3576US11271370B2Tensile strained semiconductor photon emission and detection devices and integrated photonics systemACORN SEMI LLC·Filed 2020·Granted Mar 8, 2022·0 cites·21 claims
- 3676US7680376B2Wafer-level alignment of optical elementsAPPLIED MATERIALS INC·Filed 2007·Granted Mar 16, 2010·7 cites·16 claims
- 3775US11322615B2SOI wafers and devices with buried stressorACORN SEMI LLC·Filed 2020·Granted May 3, 2022·0 cites·20 claims
- 3875US2025306181A1Mobile apparatus and method for capturing an object spaceNAVVIS GMBH·Filed 2025·Application pending·0 cites
- 3973US8369658B2Optical modulators employing charge state control of deep levelsKNIGHTS ANDREW P·Filed 2010·Granted Feb 5, 2013·3 cites·21 claims
- 4072US10879366B2Metal contacts to group IV semiconductors by inserting interfacial atomic monolayersACORN SEMI LLC·Filed 2019·Granted Dec 29, 2020·0 cites·29 claims
- 4165US10553695B2MIS contact structure with metal oxide conductorACORN TECH INC·Filed 2018·Granted Feb 4, 2020·0 cites·14 claims
- 4265US10505005B2Metal contacts to group IV semiconductors by inserting interfacial atomic monolayersACORN TECH INC·Filed 2017·Granted Dec 10, 2019·0 cites·10 claims
- 4364US10008827B2Tensile strained semiconductor photon emission and detection devices and integrated photonics systemACORN TECH INC·Filed 2016·Granted Jun 26, 2018·0 cites·20 claims
- 4463US2022229700A1Method for securely executing a workflow in a computer systemCamelot ITLab GmbH·Filed 2022·Application pending·0 cites
- 4562US9755038B2Metal contacts to group IV semiconductors by inserting interfacial atomic monolayersACORN TECH INC·Filed 2016·Granted Sep 5, 2017·0 cites·11 claims
- 4662US9484426B2Metal contacts to group IV semiconductors by inserting interfacial atomic monolayersACORN TECH INC·Filed 2016·Granted Nov 1, 2016·0 cites·7 claims
- 4759US7869672B2Optical assemblies and methods for fabrication of optical assembliesAPPLIED MATERIALS INC·Filed 2007·Granted Jan 11, 2011·1 cites·16 claims
- 4858US8023782B2Method and apparatus for demultiplexing optical signals in a passive optical networkAPPLIED MATERIALS INC·Filed 2009·Granted Sep 20, 2011·1 cites·25 claims
- 4955US2025321392A1Electrical and optical interconnect links combined in a hybrid interposerACORN SEMI LLC·Filed 2025·Application pending·0 cites
- 5050US5402456ANuclear reactor system and method for operating the sameSIEMENS AG·Filed 1993·Granted Mar 28, 1995·14 cites·21 claims
Showing the top 50 of 55 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →