Inventor · disambiguated record
Ardis Liang
Also filed as: LIANG ARDIS
7 granted patents·50 citations·filing 2005–2024
81Inventor score
Top patents by PatentIndex Score
7 records- 0194US8204296B2Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a waferBHASKAR KRIS·Filed 2010·Granted Jun 19, 2012·15 cites·16 claims
- 0293US7796804B2Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a waferKLA TENCOR CORP·Filed 2008·Granted Sep 14, 2010·25 cites·28 claims
- 0376US11055840B2Semiconductor hot-spot and process-window discovery combining optical and electron-beam inspectionKLA CORP·Filed 2019·Granted Jul 6, 2021·2 cites·19 claims
- 0471US9835566B2Adaptive nuisance filterKLA TENCOR CORP·Filed 2016·Granted Dec 5, 2017·1 cites·27 claims
- 0570US7345753B2Apparatus and methods for analyzing defects on a sampleKLA TENCOR TECH CORP·Filed 2005·Granted Mar 18, 2008·6 cites·19 claims
- 0663US10209628B2System and method for defect classification based on electrical design intentKLA TENCOR CORP·Filed 2016·Granted Feb 19, 2019·1 cites·40 claims
- 0758US12387310B2Wafer signature local maxima via clustering for metrology guided inspectionKLA CORP·Filed 2024·Granted Aug 12, 2025·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →