Inventor · disambiguated record
Boguslaw Nagorski
Also filed as: NAGORSKI BOGUSLAW · NAGORSKI BOGUSLAW A · NAGORSKI BOGUSLAW ANDRZEJ
11 granted patents·1 pending application·742 citations·filing 1981–2006
93Inventor score
Top patents by PatentIndex Score
12 records- 0198US5558568AWafer polishing machine with fluid bearingsONTRAK SYSTEMS INC·Filed 1994·Granted Sep 24, 1996·204 cites·17 claims
- 0297US5593344AWafer polishing machine with fluid bearings and drive systemsONTRAK SYSTEMS INC·Filed 1994·Granted Jan 14, 1997·154 cites·25 claims
- 0396US6482307B2Method of and apparatus for making electrical contact to wafer surface for full-face electroplating or electropolishingNUTOOL INC·Filed 2000·Granted Nov 19, 2002·126 cites·28 claims
- 0494US6352623B1Vertically configured chamber used for multiple processesNUTOOL INC·Filed 1999·Granted Mar 5, 2002·131 cites·66 claims
- 0591US6612915B1Work piece carrier head for plating and polishingNUTOOL INC·Filed 1999·Granted Sep 2, 2003·74 cites·20 claims
- 0680US6852208B2Method and apparatus for full surface electrotreating of a waferNUTOOL INC·Filed 2002·Granted Feb 8, 2005·20 cites·16 claims
- 0772US4447019AMagnetic tape cartridge with resilient belt driving means and separate tape and belt idlersFUJI PHOTO FILM CO LTD·Filed 1981·Granted May 8, 1984·16 cites·8 claims
- 0865US7211174B2Method and system to provide electrical contacts for electrotreating processesNOVELLUS SYSTEMS INC·Filed 2002·Granted May 1, 2007·10 cites·16 claims
- 0954US7059944B2Integrated system for processing semiconductor wafersASM NUTOOL INC·Filed 2003·Granted Jun 13, 2006·3 cites·16 claims
- 1052US6969456B2Method of using vertically configured chamber used for multiple processesASM NUTOOL INC·Filed 2001·Granted Nov 29, 2005·2 cites·28 claims
- 1151US7476304B2Apparatus for processing surface of workpiece with small electrodes and surface contactsNOVELLUS SYSTEMS INC·Filed 2004·Granted Jan 13, 2009·2 cites·20 claims
- 1242US2007004316A1Integrated system for processing semiconductor wafersASHJAEE JALAL·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →