Inventor · disambiguated record
Cecelia Campochiaro
Also filed as: CAMPOCHIARO CECELIA · CAMPOCHIARO CECELIA ANNE
6 granted patents·2 pending applications·237 citations·filing 2004–2020
82Inventor score
Top patents by PatentIndex Score
8 records- 0195US8126255B2Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functionsBHASKAR KRIS·Filed 2008·Granted Feb 28, 2012·174 cites·61 claims
- 0293US8611639B2Semiconductor device property extraction, generation, visualization, and monitoring methodsKULKARNI ASHOK·Filed 2007·Granted Dec 17, 2013·33 cites·38 claims
- 0381US7142992B1Flexible hybrid defect classification for semiconductor manufacturingKLA TENCOR TECH CORP·Filed 2004·Granted Nov 28, 2006·28 cites·19 claims
- 0465US9318395B2Systems and methods for preparation of samples for sub-surface defect reviewKLA TENCOR CORP·Filed 2012·Granted Apr 19, 2016·2 cites·20 claims
- 0563US11605525B2System and method of preparing integrated circuits for backside probing using charged particle beamsFEI CO·Filed 2020·Granted Mar 14, 2023·0 cites·17 claims
- 0660US2019287762A1System and method of preparing integrated circuits for backside probing using charged particle beamsFEI CO·Filed 2019·Application pending·0 cites
- 0749US10373795B2Integrated circuit analysis systems and methods with localized evacuated volume for e-beam operationFEI CO·Filed 2017·Granted Aug 6, 2019·0 cites·21 claims
- 0842US2019227119A1System and method of preparing integrated circuits for backside probing using charged particle beamsFEI CO·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →