Inventor · disambiguated record
Chetana Bhaskar
Also filed as: BHASKAR CHETANA
6 granted patents·1 pending application·589 citations·filing 1994–2022
84Inventor score
Top patents by PatentIndex Score
7 records- 0195US8126255B2Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functionsBHASKAR KRIS·Filed 2008·Granted Feb 28, 2012·174 cites·61 claims
- 0295US5502306AElectron beam inspection system and methodKLA INSTR CORP·Filed 1994·Granted Mar 26, 1996·400 cites·35 claims
- 0388US9262821B2Inspection recipe setup from reference image variationKLA TENCOR CORP·Filed 2015·Granted Feb 16, 2016·8 cites·38 claims
- 0487US10395358B2High sensitivity repeater defect detectionKLA TENCOR CORP·Filed 2017·Granted Aug 27, 2019·7 cites·35 claims
- 0570US2022230293A1Method and system for mixed mode wafer inspectionKLA CORP·Filed 2022·Application pending·0 cites
- 0659US11295438B2Method and system for mixed mode wafer inspectionKLA TENCOR CORP·Filed 2018·Granted Apr 5, 2022·0 cites·9 claims
- 0753US10192303B2Method and system for mixed mode wafer inspectionKLA TENCOR CORP·Filed 2013·Granted Jan 29, 2019·0 cites·34 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →