Inventor · disambiguated record
David Alles
Also filed as: ALLES DAVID · ALLES DAVID S
17 granted patents·651 citations·filing 1977–2014
95Inventor score
Files withKLA TENCOR CORP6KLA TENCOR TECH CORP5KLA TENCOR3BELL TELEPHONE LABOR INC2WRIGHT MICHAEL J1
Top patents by PatentIndex Score
17 records- 0196US7738093B2Methods for detecting and classifying defects on a reticleKLA TENCOR CORP·Filed 2008·Granted Jun 15, 2010·42 cites·21 claims
- 0296US7123356B1Methods and systems for inspecting reticles using aerial imaging and die-to-database detectionKLA TENCOR TECH CORP·Filed 2003·Granted Oct 17, 2006·126 cites·22 claims
- 0396US7027143B1Methods and systems for inspecting reticles using aerial imaging at off-stepper wavelengthsKLA TENCOR TECH CORP·Filed 2003·Granted Apr 11, 2006·107 cites·20 claims
- 0495US7379175B1Methods and systems for reticle inspection and defect review using aerial imagingKLA TENCOR TECH CORP·Filed 2003·Granted May 27, 2008·99 cites·20 claims
- 0595US6529621B1Mechanisms for making and inspecting reticlesKLA TENCOR·Filed 1998·Granted Mar 4, 2003·135 cites·38 claims
- 0693US6748103B2Mechanisms for making and inspecting reticlesKLA TENCOR·Filed 2003·Granted Jun 8, 2004·45 cites·26 claims
- 0781US7835015B1Auto focus system for reticle inspectionKLA TENCOR CORP·Filed 2008·Granted Nov 16, 2010·11 cites·13 claims
- 0876US8772731B2Apparatus and method for synchronizing sample stage motion with a time delay integration charge-couple device in a semiconductor inspection toolKLA TENCOR CORP·Filed 2013·Granted Jul 8, 2014·2 cites·19 claims
- 0974US6654489B2Apparatus and methods for collecting global data during a reticle inspectionKLA TENCOR TECH CORP·Filed 2002·Granted Nov 25, 2003·17 cites·31 claims
- 1073US9348214B2Spectral purity filter and light monitor for an EUV reticle inspection systemKLA TENCOR CORP·Filed 2014·Granted May 24, 2016·2 cites·13 claims
- 1170US7046352B1Surface inspection system and method using summed light analysis of an inspection surfaceKLA TENCOR TECH CORP·Filed 2002·Granted May 16, 2006·16 cites·18 claims
- 1270US4163155ADefining a low-density pattern in a photoresist with an electron beam exposure systemBELL TELEPHONE LABOR INC·Filed 1978·Granted Jul 31, 1979·14 cites·5 claims
- 1363US6516085B1Apparatus and methods for collecting global data during a reticle inspectionKLA TENCOR·Filed 1999·Granted Feb 4, 2003·30 cites·29 claims
- 1454US7926959B1Beam conditioning to reduce spatial coherenceKLA TENCOR CORP·Filed 2008·Granted Apr 19, 2011·1 cites·24 claims
- 1545US9619878B2Inspecting high-resolution photolithography masksKLA TENCOR CORP·Filed 2014·Granted Apr 11, 2017·0 cites·20 claims
- 1640US8928895B2Auto focus system for reticle inspectionWRIGHT MICHAEL J·Filed 2010·Granted Jan 6, 2015·0 cites·7 claims
- 1732US4159799ACassette unit and fixture for loading the unit with a planar memberBELL TELEPHONE LABOR INC·Filed 1977·Granted Jul 3, 1979·4 cites·8 claims
Join the waitlist — get patent alerts
Get an alert when David Alles files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →