Inventor · disambiguated record
David L. Brown
Also filed as: BROWN DAVID L · BROWN DAVID LEE
52 granted patents·5 pending applications·790 citations·filing 1998–2022
98Inventor score
Top patents by PatentIndex Score
57 records- 0198US7528943B2Method and apparatus for simultaneous high-speed acquisition of multiple imagesKLA TENCOR TECH CORP·Filed 2005·Granted May 5, 2009·76 cites·28 claims
- 0297US9818887B2Back-illuminated sensor with boron layerKLA TENCOR CORP·Filed 2016·Granted Nov 14, 2017·11 cites·15 claims
- 0397US9496425B2Back-illuminated sensor with boron layerKLA TENCOR CORP·Filed 2013·Granted Nov 15, 2016·29 cites·26 claims
- 0497US9478402B2Photomultiplier tube, image sensor, and an inspection system using a PMT or image sensorKLA TENCOR CORP·Filed 2014·Granted Oct 25, 2016·20 cites·10 claims
- 0597US7952633B2Apparatus for continuous clocking of TDI sensorsKLA TENCOR TECH CORP·Filed 2005·Granted May 31, 2011·63 cites·26 claims
- 0696US11114491B2Back-illuminated sensor and a method of manufacturing a sensorKLA CORP·Filed 2019·Granted Sep 7, 2021·8 cites·16 claims
- 0796US10121914B2Back-illuminated sensor with boron layerKLA TENCOR CORP·Filed 2017·Granted Nov 6, 2018·9 cites·14 claims
- 0895US10446696B2Back-illuminated sensor with boron layerKLA TENCOR CORP·Filed 2018·Granted Oct 15, 2019·5 cites·18 claims
- 0995US9767986B2Scanning electron microscope and methods of inspecting and reviewing samplesKLA TENCOR CORP·Filed 2015·Granted Sep 19, 2017·13 cites·21 claims
- 1095US9748294B2Anti-reflection layer for back-illuminated sensorKLA TENCOR CORP·Filed 2015·Granted Aug 29, 2017·15 cites·10 claims
- 1195US9426400B2Method and apparatus for high speed acquisition of moving images using pulsed illuminationKLA TENCOR CORP·Filed 2013·Granted Aug 23, 2016·32 cites·20 claims
- 1295US8624971B2TDI sensor modules with localized driving and signal processing circuitry for high speed inspectionBROWN DAVID L·Filed 2009·Granted Jan 7, 2014·22 cites·46 claims
- 1395US7609309B2Continuous clocking of TDI sensorsKLA TENCOR TECH CORP·Filed 2004·Granted Oct 27, 2009·78 cites·66 claims
- 1495US7136159B2Excimer laser inspection systemKLA TENCOR TECH CORP·Filed 2002·Granted Nov 14, 2006·69 cites·44 claims
- 1595US6137570ASystem and method for analyzing topological features on a surfaceKLA TENCOR CORP·Filed 1998·Granted Oct 24, 2000·161 cites·29 claims
- 1692US11187223B2Home flood prevention appliance systemLOGICAL CONCEPTS INC·Filed 2019·Granted Nov 30, 2021·12 cites·18 claims
- 1792US10197501B2Electron-bombarded charge-coupled device and inspection systems using EBCCD detectorsKLA TENCOR CORP·Filed 2012·Granted Feb 5, 2019·11 cites·23 claims
- 1892US8754972B2Integrated multi-channel analog front end and digitizer for high speed imaging applicationsBROWN DAVID L·Filed 2012·Granted Jun 17, 2014·20 cites·39 claims
- 1991US10466212B2Scanning electron microscope and methods of inspecting and reviewing samplesKLA TENCOR CORP·Filed 2017·Granted Nov 5, 2019·7 cites·14 claims
- 2091US9439050B2Wireless electronic device configuration systemLOGICAL CONCEPTS INC·Filed 2013·Granted Sep 6, 2016·12 cites·23 claims
- 2191US9077862B2TDI sensor modules with localized driving and signal processing circuitry for high speed inspectionKLA TENCOR CORP·Filed 2013·Granted Jul 7, 2015·7 cites·42 claims
- 2291US7728968B2Excimer laser inspection systemKLA TENCOR TECH CORP·Filed 2006·Granted Jun 1, 2010·14 cites·30 claims
- 2389US10269842B2Anti-reflection layer for back-illuminated sensorKLA TENCOR CORP·Filed 2017·Granted Apr 23, 2019·5 cites·9 claims
- 2489US9860466B2Sensor with electrically controllable aperture for inspection and metrology systemsKLA TENCOR CORP·Filed 2016·Granted Jan 2, 2018·6 cites·23 claims
- 2587US9793673B2Semiconductor inspection and metrology system using laser pulse multiplierCHUANG YUNG-HO·Filed 2012·Granted Oct 17, 2017·5 cites·12 claims
- 2686US10462391B2Dark-field inspection using a low-noise sensorKLA TENCOR CORP·Filed 2016·Granted Oct 29, 2019·5 cites·21 claims
- 2786US7714300B1High-speed high-efficiency solid-state electron detectorKLA TENCOR TECH CORP·Filed 2007·Granted May 11, 2010·8 cites·11 claims
- 2886US7649365B1Inline inspection of photovoltaics for electrical defectsKLA TENCOR CORP·Filed 2007·Granted Jan 19, 2010·11 cites·1 claims
- 2985US11114489B2Back-illuminated sensor and a method of manufacturing a sensorKLA TENCOR CORP·Filed 2019·Granted Sep 7, 2021·4 cites·18 claims
- 3085US11022124B2Whole home water appliance systemLOGICAL CONCEPTS INC·Filed 2018·Granted Jun 1, 2021·5 cites·18 claims
- 3184US7465913B2System and method for sensing using adjustable modulation transfer function (MTF) with voltage variations relative to depletion depth at a pixelKLA TENCOR CORP·Filed 2006·Granted Dec 16, 2008·6 cites·19 claims
- 3283US8748828B2Interposer based imaging sensor for high-speed image acquisition and inspection systemsKLA TENCOR CORP·Filed 2012·Granted Jun 10, 2014·6 cites·33 claims
- 3382US8553217B2EUV high throughput inspection system for defect detection on patterned EUV masks, mask blanks, and wafersCHUANG YUNG-HO·Filed 2010·Granted Oct 8, 2013·3 cites·56 claims
- 3481US10764527B2Dual-column-parallel CCD sensor and inspection systems using a sensorKLA TENCOR CORP·Filed 2019·Granted Sep 1, 2020·3 cites·15 claims
- 3581US9377414B2EUV high throughput inspection system for defect detection on patterned EUV masks, mask blanks, and wafersKLA TENCOR CORP·Filed 2014·Granted Jun 28, 2016·2 cites·18 claims
- 3679US9972959B2Semiconductor inspection and metrology system using laser pulse multiplierKLA TENCOR CORP·Filed 2016·Granted May 15, 2018·2 cites·13 claims
- 3779US9347890B2Low-noise sensor and an inspection system using a low-noise sensorKLA TENCOR CORP·Filed 2014·Granted May 24, 2016·3 cites·20 claims
- 3877US10778925B2Multiple column per channel CCD sensor architecture for inspection and metrologyKLA TENCOR CORP·Filed 2019·Granted Sep 15, 2020·1 cites·21 claims
- 3975US9299738B1Interposer based imaging sensor for high-speed image acquisition and inspection systemsKLA TENCOR CORP·Filed 2014·Granted Mar 29, 2016·3 cites·19 claims
- 4075US7126100B1System and method for sensing using adjustable modulation transfer function (MTF)KLA TENCOR TECH CORP·Filed 2004·Granted Oct 24, 2006·10 cites·26 claims
- 4174US9462206B2Integrated multi-channel analog front end and digitizer for high speed imaging applicationsKLA TENCOR CORP·Filed 2014·Granted Oct 4, 2016·2 cites·20 claims
- 4274US8692986B2EUV high throughput inspection system for defect detection on patterned EUV masks, mask blanks, and wafersKLA TENCOR CORP·Filed 2013·Granted Apr 8, 2014·1 cites·19 claims
- 4373US10194108B2Sensor with electrically controllable aperture for inspection and metrology systemsKLA TENCOR CORP·Filed 2017·Granted Jan 29, 2019·1 cites·20 claims
- 4467US7906972B2Inline inspection of photovoltaics for electrical defectsKLA TENCOR CORP·Filed 2009·Granted Mar 15, 2011·2 cites·12 claims
- 4566US10313622B2Dual-column-parallel CCD sensor and inspection systems using a sensorKLA TENCOR CORP·Filed 2016·Granted Jun 4, 2019·1 cites·12 claims
- 4665US10429321B2Apparatus for high-speed imaging sensor data transferKLA TENCOR CORP·Filed 2017·Granted Oct 1, 2019·1 cites·26 claims
- 4763US2022042504A1Home flood prevention appliance systemLOGICAL CONCEPTS INC·Filed 2021·Application pending·0 cites
- 4861US10193293B2Semiconductor inspection and metrology system using laser pulse multiplierKLA TENCOR CORP·Filed 2018·Granted Jan 29, 2019·0 cites·8 claims
- 4955US2010301437A1Anti-Reflective Coating For Sensors Suitable For High Throughput Inspection SystemsKLA TENCOR CORP·Filed 2009·Application pending·0 cites
- 5055US2022397536A1Sensors, imaging systems, and methods for forming a sensorKLA CORP·Filed 2022·Application pending·0 cites
Showing the top 50 of 57 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →