Inventor · disambiguated record
Dariusz Czysz
Also filed as: CZYSZ DARIUSZ
13 granted patents·1 pending application·205 citations·filing 2007–2018
93Inventor score
Top patents by PatentIndex Score
14 records- 0197US7797603B2Low power decompression of test cubesRAJSKI JANUSZ·Filed 2007·Granted Sep 14, 2010·59 cites·36 claims
- 0297US7647540B2Decompressors for low power decompression of test patternsRAJSKI JANUSZ·Filed 2007·Granted Jan 12, 2010·41 cites·24 claims
- 0396US7925465B2Low power scan testing techniques and apparatusMENTOR GRAPHICS CORP·Filed 2008·Granted Apr 12, 2011·37 cites·48 claims
- 0494US8166359B2Selective per-cycle masking of scan chains for system level testRAJSKI JANUSZ·Filed 2008·Granted Apr 24, 2012·19 cites·17 claims
- 0593US8290738B2Low power scan testing techniques and apparatusLIN XIJIANG·Filed 2011·Granted Oct 16, 2012·12 cites·31 claims
- 0692US8046653B2Low power decompression of test cubesMENTOR GRAPHICS CORP·Filed 2010·Granted Oct 25, 2011·10 cites·17 claims
- 0787US8301945B2Decompressors for low power decompression of test patternsRAJSKI JANUSZ·Filed 2011·Granted Oct 30, 2012·5 cites·20 claims
- 0882US8726113B2Selective per-cycle masking of scan chains for system level testRAJSKI JANUSZ·Filed 2012·Granted May 13, 2014·4 cites·25 claims
- 0980US9377508B2Selective per-cycle masking of scan chains for system level testMENTOR GRAPHICS CORP·Filed 2014·Granted Jun 28, 2016·2 cites·22 claims
- 1080US8347159B2Compression based on deterministic vector clustering of incompatible test cubesMENTOR GRAPHICS CORP·Filed 2010·Granted Jan 1, 2013·4 cites·19 claims
- 1178US8015461B2Decompressors for low power decompression of test patternsMENTOR GRAPHICS CORP·Filed 2009·Granted Sep 6, 2011·6 cites·20 claims
- 1273US8832512B2Low power compression of incompatible test cubesCZYSZ DARIUSZ·Filed 2011·Granted Sep 9, 2014·6 cites·12 claims
- 1365US2018143249A1Selective per-cycle masking of scan chains for system level testRAJSKI JANUSZ·Filed 2018·Application pending·0 cites
- 1462US9874606B2Selective per-cycle masking of scan chains for system level testMENTOR GRAPHICS CORP·Filed 2016·Granted Jan 23, 2018·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →