Inventor · disambiguated record
David A. Johnson
Also filed as: JOHNSON DAVID · JOHNSON DAVID A · JOHNSON DAVID ALLEN
55 granted patents·5 pending applications·1,545 citations·filing 1982–2021
99Inventor score
Files withJOHNSTECH INT CORP30TEKMAX INC6MITEK HOLDINGS INC4VITESSE SEMICONDUCTOR CORP4JOHNSON DAVID3
Top patents by PatentIndex Score
60 records- 0195US10725069B1Integrated circuit contactor for testing ICs and method of constructionJOHNSTECH INT CORP·Filed 2018·Granted Jul 28, 2020·13 cites·16 claims
- 0295US4824307AApparatus for vertically stacking battery platesTEKMAX INC·Filed 1988·Granted Apr 25, 1989·91 cites·6 claims
- 0394US4581087AMethod of making a thermoplastic adhesive-coated tapeKENDALL & CO·Filed 1983·Granted Apr 8, 1986·94 cites·1 claims
- 0494US4472461AMethod for producing perforations in an adhesive-coated porous webKENDALL & CO·Filed 1982·Granted Sep 18, 1984·77 cites·15 claims
- 0592US9429591B1On-center electrically conductive pins for integrated testingJOHNSTECH INT CORP·Filed 2014·Granted Aug 30, 2016·9 cites·11 claims
- 0691US11879925B1Over the air (OTA) chip testing systemJOHNSTECH INT CORP·Filed 2021·Granted Jan 23, 2024·4 cites·20 claims
- 0790US4822234APlate feed apparatusTEKMAX INC·Filed 1987·Granted Apr 18, 1989·66 cites·6 claims
- 0888US10436819B1Constant pressure pin tip for testing integrated circuit chipsJOHNSTECH INT CORP·Filed 2018·Granted Oct 8, 2019·3 cites·11 claims
- 0988US10114039B1Selectively geometric shaped contact pin for electronic component testing and method of fabricationJOHNSTECH INT CORP·Filed 2016·Granted Oct 30, 2018·10 cites·10 claims
- 1088US5069629AElectrical interconnect contact systemJOHNSON DAVID A·Filed 1991·Granted Dec 3, 1991·72 cites·6 claims
- 1186US9958499B1Constant stress pin tip for testing integrated circuit chipsJOHNSTECH INT CORP·Filed 2016·Granted May 1, 2018·3 cites·5 claims
- 1285US5645433AContacting system for electrical devicesJOHNSTECH INT CORP·Filed 1994·Granted Jul 8, 1997·55 cites·43 claims
- 1384US5360348AIntegrated circuit device test socketJOHNSTECH INT CORP·Filed 1993·Granted Nov 1, 1994·54 cites·6 claims
- 1484US5207584AElectrical interconnect contact systemJOHNSON DAVID A·Filed 1991·Granted May 4, 1993·56 cites·4 claims
- 1582US9476936B1Thermal management for microcircuit testing systemJOHNSTECH INT CORP·Filed 2014·Granted Oct 25, 2016·6 cites·7 claims
- 1682USD749526SArticulating contact pinJOHNSTECH INT CORP·Filed 2015·Granted Feb 16, 2016·18 cites·1 claims
- 1782US5634801AElectrical interconnect contact systemJOHNSTECH INT CORP·Filed 1994·Granted Jun 3, 1997·51 cites·12 claims
- 1881US6971838B2Battery plate feeder having low vacuum, high flow rate pick-up headMITEK HOLDINGS INC·Filed 2002·Granted Dec 6, 2005·27 cites·11 claims
- 1980US5967848AApparatus for providing controlled impedance in an electrical contactJOHNSTECH INT CORP·Filed 1997·Granted Oct 19, 1999·33 cites·6 claims
- 2079US5129643AApparatus for stacking pasted battery platesNEIDS INC·Filed 1990·Granted Jul 14, 1992·30 cites·4 claims
- 2179US4758126APlate feed apparatusJOHNSON PETER E·Filed 1987·Granted Jul 19, 1988·44 cites·7 claims
- 2277US5639247AContacting system for electrical devicesJOHNSTECH INT CORP·Filed 1995·Granted Jun 17, 1997·42 cites·60 claims
- 2377US5102287APlate handling apparatusTEKMAX INC·Filed 1990·Granted Apr 7, 1992·34 cites·7 claims
- 2476US9341649B1On-center electrically conductive pins for integrated testingJOHNSTECH INT CORP·Filed 2014·Granted May 17, 2016·3 cites·6 claims
- 2573US6203329B1Impedance controlled interconnection deviceJOHNSTECH INT CORP·Filed 1996·Granted Mar 20, 2001·36 cites·24 claims
- 2673US6030171ABattery plate feeder having oscillating pick-up headTEKMAX INC·Filed 1999·Granted Feb 29, 2000·18 cites·4 claims
- 2773US5326374ABody-implantable device for controlling the size of a fluid passagewayILBAWI MICHAEL N·Filed 1992·Granted Jul 5, 1994·156 cites·17 claims
- 2872USD749525SArticulating contact pinJOHNSTECH INT CORP·Filed 2015·Granted Feb 16, 2016·11 cites·1 claims
- 2971USD727269SArticulating contact pinJOHNSON DAVID·Filed 2014·Granted Apr 21, 2015·12 cites·1 claims
- 3071US7464516B2Over-wrap apparatus and method for a bobbin and paperSCHWEITZER MANDUIT INTERNATION·Filed 2006·Granted Dec 16, 2008·7 cites·9 claims
- 3170US4737116AImpedance matching blockMICRO COMPONENT TECHNOLOGY INC·Filed 1986·Granted Apr 12, 1988·30 cites·6 claims
- 3269US9638714B2On-center electrically conductive pins for integrated testingJOHNSTECH INT CORP·Filed 2014·Granted May 2, 2017·2 cites·14 claims
- 3369US5388996AElectrical interconnect contact systemFiled 1993·Granted Feb 14, 1995·30 cites·9 claims
- 3468US5336094AApparatus for interconnecting electrical contactsJOHNSTECH INT CORP·Filed 1993·Granted Aug 9, 1994·30 cites·21 claims
- 3566US11209458B2Integrated circuit contactor for testing ICs and method of constructionJOHNSTECH INT CORP·Filed 2020·Granted Dec 28, 2021·0 cites·15 claims
- 3665US5749738AElectrical interconnect contact systemJOHNSTECH INT CORP·Filed 1996·Granted May 12, 1998·27 cites·14 claims
- 3765US5578060APhysical therapy apparatus having an interactive interface, and method of configuring sameCHATTANOOGA GROUP INC·Filed 1995·Granted Nov 26, 1996·133 cites·37 claims
- 3864US5144410AOhmic contact for III-V semiconductor devicesVITESSE SEMICONDUCTOR CORP·Filed 1991·Granted Sep 1, 1992·23 cites·12 claims
- 3962USD711836SArticulating contact pinJOHNSON DAVID·Filed 2013·Granted Aug 26, 2014·11 cites·1 claims
- 4061US4835464ADecoupling apparatus for use with integrated circuit testerMICRO COMPONENT TECHNOLOGY INC·Filed 1988·Granted May 30, 1989·21 cites·8 claims
- 4160US11029335B1Selectively geometric shaped contact pin for electronic component testing and method of fabricationJOHNSTECH INT CORP·Filed 2018·Granted Jun 8, 2021·0 cites·10 claims
- 4260USD719923SArticulating contact pinJOHNSON DAVID·Filed 2014·Granted Dec 23, 2014·10 cites·1 claims
- 4358US10401386B2On-center electrically conductive pins for integrated testingJOHNSTECH INT CORP·Filed 2016·Granted Sep 3, 2019·0 cites·8 claims
- 4458US6062807ABattery plate feeder having oscillating pick-up headTEKMAX INC·Filed 1998·Granted May 16, 2000·11 cites·9 claims
- 4557US2008268666A1Apparatus for providing controlled impedance in an electrical contactJOHNSTECH INT CORP·Filed 2008·Application pending·0 cites
- 4656US5254834AMethod of forming closely-spaced, generally parallel slots through a thin wall and product formed therebyJOHNSTECH INT CORP·Filed 1992·Granted Oct 19, 1993·15 cites·23 claims
- 4755US6861667B2Grounding insertsJOHNSTECH INT CORP·Filed 2003·Granted Mar 1, 2005·10 cites·13 claims
- 4854US5121174AGate-to-ohmic metal contact scheme for III-V devicesVITESSE SEMICONDUCTOR CORP·Filed 1990·Granted Jun 9, 1992·19 cites·8 claims
- 4954US2010136840A1Apparatus for providing controlled impedance in an electrical contactJOHNSON DAVID A·Filed 2010·Application pending·0 cites
- 5051US6685753B1Method of installing an edge piece on a battery plate and apparatus for performing sameTEKMAX INC·Filed 2000·Granted Feb 3, 2004·3 cites·14 claims
Showing the top 50 of 60 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →