Inventor · disambiguated record
David J. Walker
Also filed as: LONG ROBERT THOMAS · WALKER DAVID · WALKER DAVID I · WALKER DAVID J
44 granted patents·2 pending applications·1,746 citations·filing 1977–2008
99Inventor score
Files withBABCOCK & WILCOX CO19KLA TENCOR6KLA TENCOR TECH CORP5KLA TENCOR CORP4BABCOCK & WILCOX POWER GENERAT2
Top patents by PatentIndex Score
46 records- 0198US7656170B2Multiple directional scans of test structures on semiconductor integrated circuitsKLA TENCOR TECH CORP·Filed 2007·Granted Feb 2, 2010·96 cites·12 claims
- 0298US6771806B1Multi-pixel methods and apparatus for analysis of defect information from test structures on semiconductor devicesKLA TENCOR·Filed 2000·Granted Aug 3, 2004·258 cites·27 claims
- 0396US6636064B1Dual probe test structures for semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted Oct 21, 2003·127 cites·22 claims
- 0496US6633174B1Stepper type test structures and methods for inspection of semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted Oct 14, 2003·195 cites·14 claims
- 0596US5973323AApparatus and method for secondary electron emission microscopeKLA TENCOR CORP·Filed 1997·Granted Oct 26, 1999·138 cites·45 claims
- 0695US6524873B1Continuous movement scans of test structures on semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted Feb 25, 2003·102 cites·23 claims
- 0794US7012439B2Multiple directional scans of test structures on semiconductor integrated circuitsKLA TENCOR TECH CORP·Filed 2005·Granted Mar 14, 2006·21 cites·9 claims
- 0893US5343830ACirculating fluidized bed reactor with internal primary particle separation and returnBABCOCK & WILCOX CO·Filed 1993·Granted Sep 6, 1994·86 cites·28 claims
- 0992US6921672B2Test structures and methods for inspection of semiconductor integrated circuitsKLA TENCOR TECH CORP·Filed 2003·Granted Jul 26, 2005·59 cites·12 claims
- 1092US6566885B1Multiple directional scans of test structures on semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted May 20, 2003·57 cites·24 claims
- 1192US6528818B1Test structures and methods for inspection of semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted Mar 4, 2003·60 cites·19 claims
- 1288US6532905B2CFB with controllable in-bed heat exchangerBABCOCK & WILCOX CO·Filed 2001·Granted Mar 18, 2003·45 cites·24 claims
- 1388US6087659AApparatus and method for secondary electron emission microscopeKLA TENCOR CORP·Filed 1999·Granted Jul 11, 2000·44 cites·27 claims
- 1485US6867606B2Multiple directional scans of test structures on semiconductor integrated circuitsKLA TENCOR TECHNOLOGIES INC·Filed 2003·Granted Mar 15, 2005·28 cites·6 claims
- 1585US6627884B2Simultaneous flooding and inspection for charge control in an electron beam inspection machineKLA TENCOR TECH CORP·Filed 2001·Granted Sep 30, 2003·29 cites·30 claims
- 1682US6454824B1CFB impact type particle collection elements attached to cooled supportsBABCOCK & WILCOX CO·Filed 2001·Granted Sep 24, 2002·33 cites·17 claims
- 1778US6863703B2Compact footprint CFB with mechanical dust collectorBABCOCK & WILCOX CO·Filed 2002·Granted Mar 8, 2005·17 cites·19 claims
- 1878US4891052AImpingement type solids collector discharge restrictorBABCOCK & WILCOX CO·Filed 1989·Granted Jan 2, 1990·32 cites·17 claims
- 1976US4992085AInternal impact type particle separatorBABCOCK & WILCOX CO·Filed 1990·Granted Feb 12, 1991·42 cites·15 claims
- 2074US7464669B2Integrated fluidized bed ash coolerBABCOCK & WILCOX POWER GENERAT·Filed 2006·Granted Dec 16, 2008·7 cites·13 claims
- 2171US6255983B1Degasser guideUSS ENG & CONSULT·Filed 2000·Granted Jul 3, 2001·18 cites·14 claims
- 2269US6322603B1Particulate collector channel with cooling inner elements in a CFB boilerBABCOCK & WILCOX CO·Filed 2000·Granted Nov 27, 2001·14 cites·10 claims
- 2369US6130637AMeasuring the thickness of hot slag in steelmakingUSS ENG & CONSULT·Filed 1998·Granted Oct 10, 2000·34 cites·19 claims
- 2469US6044805AWall protection from downward flowing solidsBABCOCK & WILCOX CO·Filed 1999·Granted Apr 4, 2000·23 cites·20 claims
- 2568US5836257ACirculating fluidized bed furnace/reactor with an integral secondary air plenumMCDERMOTT TECHNOLOGY INC·Filed 1996·Granted Nov 17, 1998·27 cites·9 claims
- 2665US8601816B2Closed-cycle MHD-faraday generation of electric power using steam as the gaseous mediumWALKER DAVID J·Filed 2007·Granted Dec 10, 2013·5 cites·69 claims
- 2763US6500221B2Cooled tubes arranged to form impact type particle separatorsBABCOCK & WILCOX CO·Filed 2001·Granted Dec 31, 2002·11 cites·38 claims
- 2861US6491000B1Wall protection from downward flowing solidsBABCOCK & WILCOX CO·Filed 2000·Granted Dec 10, 2002·10 cites·20 claims
- 2960US6868795B2Bubble cap assemblyBABCOCK & WILCOX CO·Filed 2003·Granted Mar 22, 2005·10 cites·21 claims
- 3060US5809940AIndirect cooling of primary impact type solids separator elements in a CFB reactorBABCOCK & WILCOX CO·Filed 1997·Granted Sep 22, 1998·25 cites·9 claims
- 3159US6095095ACirculating fluidized bed reactor with floored internal primary particle separatorBACOCK & WILCOX COMPANY·Filed 1998·Granted Aug 1, 2000·21 cites·38 claims
- 3256US6713759B2Apparatus and method for secondary electron emission microscopeKLA TENCOR CORP·Filed 2001·Granted Mar 30, 2004·2 cites·8 claims
- 3354US7566873B1High-resolution, low-distortion and high-efficiency optical coupling in detection system of electron beam apparatusKLA TENCOR TECH CORP·Filed 2006·Granted Jul 28, 2009·2 cites·21 claims
- 3454US5799593ADrainable discharge pan for impact type particle separatorMCDERMOTT TECHNOLOGY INC·Filed 1996·Granted Sep 1, 1998·16 cites·29 claims
- 3554US4860694AControlled discharge from a standpipe containing particulate materialsBABCOCK & WILCOX CO·Filed 1988·Granted Aug 29, 1989·13 cites·18 claims
- 3652US5893340AErosion protection at line discontinuity for enclosure and internal walls in fluidized bed combustors and reactorsBABCOCK & WILCOX CO·Filed 1997·Granted Apr 13, 1999·15 cites·14 claims
- 3750US8047162B2Black plant steam furnace injectionBABCOCK & WILCOX POWER GENERAT·Filed 2008·Granted Nov 1, 2011·0 cites·17 claims
- 3849US7282087B2Wetted particle and droplet impingement surfaceBABCOCK & WILCOX CO·Filed 2004·Granted Oct 16, 2007·1 cites·41 claims
- 3944US6984822B2Apparatus and method for secondary electron emission microscopeKLA TENCOR CORP·Filed 2003·Granted Jan 10, 2006·0 cites·23 claims
- 4043US6681722B1Floored impact-type solids separator using downward expanding separator elementsBABCOCK & WILCOX CO·Filed 2002·Granted Jan 27, 2004·1 cites·10 claims
- 4141US6058858ACirculating fluidized bed reactor with plural furnace outletsBABCOCK & WILCOX CO·Filed 1996·Granted May 9, 2000·9 cites·10 claims
- 4238US4106890AAir deflectorBABCOCK & WILCOX CO·Filed 1977·Granted Aug 15, 1978·8 cites·1 claims
- 4338US2005133192A1Tundish controlFiled 2004·Application pending·0 cites
- 4437US2003136095A1Impact collector with direct and indirect impact surfacesFiled 2002·Application pending·0 cites
- 4532US4951714AMeans for vertically supporting a segmented high-temperature internal conduitBABCOCK & WILCOX CO·Filed 1989·Granted Aug 28, 1990·5 cites·9 claims
- 4620US6088990ANon-welded support for internal impact type particle separatorBABCOCK & WILCOX COMPNAY·Filed 1998·Granted Jul 18, 2000·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →