Inventor · disambiguated record
Donald Pettibone
Also filed as: PETTIBONE DONALD · PETTIBONE DONALD W · Pettibone Donald Warren
20 granted patents·404 citations·filing 1983–2021
95Inventor score
Top patents by PatentIndex Score
20 records- 0196US9891177B2TDI sensor in a darkfield systemKLA TENCOR CORP·Filed 2014·Granted Feb 13, 2018·56 cites·41 claims
- 0291US9995850B2System, method and apparatus for polarization controlKLA TENCOR CORP·Filed 2014·Granted Jun 12, 2018·8 cites·33 claims
- 0387US10324045B2Surface defect inspection with large particle monitoring and laser power controlKLA TENCOR CORP·Filed 2016·Granted Jun 18, 2019·4 cites·20 claims
- 0487US6013900AHigh efficiency lightwave ovenQUADLUX INC·Filed 1998·Granted Jan 11, 2000·73 cites·21 claims
- 0587US5990454ALightwave oven and method of cooking therewith having multiple cook modes and sequential lamp operationQUADLUX INC·Filed 1998·Granted Nov 23, 1999·90 cites·22 claims
- 0686US10462391B2Dark-field inspection using a low-noise sensorKLA TENCOR CORP·Filed 2016·Granted Oct 29, 2019·5 cites·21 claims
- 0785US10739276B2Minimizing filed size to reduce unwanted stray lightKLA TENCOR CORP·Filed 2017·Granted Aug 11, 2020·4 cites·20 claims
- 0885US6727512B2Method and system for detecting phase defects in lithographic masks and semiconductor wafersKLA TENCOR TECH CORP·Filed 2002·Granted Apr 27, 2004·27 cites·43 claims
- 0983US5883362AApparatus and method for regulating cooking time in a lightwave ovenQUADLUX INC·Filed 1995·Granted Mar 16, 1999·59 cites·32 claims
- 1080US9970873B1System and method for luminescent tag based wafer inspectionKLA TENCOR CORP·Filed 2015·Granted May 15, 2018·2 cites·31 claims
- 1177US9726615B2System and method for simultaneous dark field and phase contrast inspectionKLA TENCOR CORP·Filed 2015·Granted Aug 8, 2017·2 cites·24 claims
- 1274US5958271ALightwave oven and method of cooking therewith with cookware reflectivity compensationQUADLUX INC·Filed 1998·Granted Sep 28, 1999·54 cites·24 claims
- 1372US10921488B2System, method and apparatus for polarization controlKLA TENCOR CORP·Filed 2018·Granted Feb 16, 2021·1 cites·26 claims
- 1471US6646281B1Differential detector coupled with defocus for improved phase defect sensitivityKLA TENCOR CORP·Filed 2002·Granted Nov 11, 2003·11 cites·39 claims
- 1569US11415725B2System, method and apparatus for polarization controlKLA CORP·Filed 2021·Granted Aug 16, 2022·0 cites·20 claims
- 1668US9747670B2Method and system for improving wafer surface inspection sensitivityKLA TENCOR CORP·Filed 2014·Granted Aug 29, 2017·2 cites·22 claims
- 1748US11170971B2Multiple working distance height sensor using multiple wavelengthsKLA—TENCOR CORP·Filed 2019·Granted Nov 9, 2021·0 cites·20 claims
- 1847US11302590B2Delivery of light into a vacuum chamber using an optical fiberKLA CORP·Filed 2019·Granted Apr 12, 2022·0 cites·18 claims
- 1933US4523293ATwo-dimensional bulk acoustic wave correlator-convolverUS AIR FORCE·Filed 1983·Granted Jun 11, 1985·3 cites·10 claims
- 2025US4882540AMagnetic resonance imaging (MRI)apparatus with quadrature radio frequency (RF) coilsRESONEX INC·Filed 1988·Granted Nov 21, 1989·3 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →