Inventor · disambiguated record
Dorian Zahorski
Also filed as: ZAHORSKI DORIAN
4 granted patents·2 pending applications·1,089 citations·filing 1995–2004
85Inventor score
Technology areasG01N
Top patents by PatentIndex Score
6 records- 0195US5910842AFocused beam spectroscopic ellipsometry method and systemKLA TENCOR CORP·Filed 1996·Granted Jun 8, 1999·196 cites·18 claims
- 0295US5608526AFocused beam spectroscopic ellipsometry method and systemTENCOR INSTRUMENTS·Filed 1995·Granted Mar 4, 1997·745 cites·72 claims
- 0390US6734967B1Focused beam spectroscopic ellipsometry method and systemKLA TENCOR TECH CORP·Filed 1999·Granted May 11, 2004·136 cites·32 claims
- 0450US2005105090A1Focused beam spectroscopic ellipsometry method and systemFiled 2004·Application pending·0 cites
- 0549US2004100632A1Focused beam spectroscopic ellipsometry method and systemFiled 2003·Application pending·0 cites
- 0642US5991037AHigh spatial resolution ellipsometry deviceSOC D PRODUCTION ET DE RECH AP·Filed 1996·Granted Nov 23, 1999·12 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →