Inventor · disambiguated record
Edmund Burke
Also filed as: BURKE EDMUND · BURKE JR EDMUND CHARLES
10 granted patents·8 pending applications·46 citations·filing 1993–2014
87Inventor score
Top patents by PatentIndex Score
18 records- 0184US9209033B2GCIB etching method for adjusting fin height of finFET devicesTEL EPION INC·Filed 2014·Granted Dec 8, 2015·7 cites·20 claims
- 0263US8226835B2Ultra-thin film formation using gas cluster ion beam processingHAUTALA JOHN J·Filed 2009·Granted Jul 24, 2012·7 cites·23 claims
- 0360US6898068B2Dual mask capacitor for integrated circuitsTEXAS INSTRUMENTS INC·Filed 2003·Granted May 24, 2005·9 cites·14 claims
- 0455US8604587B2Capacitor integration at top-metal level with a protective cladding for copper surface protectionBURKE EDMUND·Filed 2010·Granted Dec 10, 2013·1 cites·12 claims
- 0554US7291897B2One mask high density capacitor for integrated circuitsTEXAS INSTRUMENTS INC·Filed 2003·Granted Nov 6, 2007·5 cites·8 claims
- 0654US6924208B2Dual mask capacitor for integrated circuitsTEXAS INSTRUMENTS INC·Filed 2004·Granted Aug 2, 2005·6 cites·31 claims
- 0749US2008020538A1One Mask High Density Capacitor for Integrated CircuitsTEXAS INSTRUMENTS INC·Filed 2007·Application pending·0 cites
- 0848US2012225532A1Method for controlling a resistive property in a resistive element using a gas cluster ion beamHAUTALA JOHN J·Filed 2011·Application pending·0 cites
- 0948US2010200774A1Multi-sequence film deposition and growth using gas cluster ion beam processingTEL EPION INC·Filed 2009·Application pending·0 cites
- 1047US7674682B2Capacitor integration at top-metal level with a protective cladding for copper surface protectionTEXAS INSTRUMENTS INC·Filed 2003·Granted Mar 9, 2010·2 cites·7 claims
- 1147US2006009030A1Novel barrier integration scheme for high-reliability viasTEXAS INSTRUMENTS INC·Filed 2005·Application pending·0 cites
- 1247US2010193898A1Method for forming trench isolation using gas cluster ion beam processingTEL EPION INC·Filed 2009·Application pending·0 cites
- 1346US7015093B2Capacitor integration at top-metal level with a protection layer for the copper surfaceTEXAS INSTRUMENTS INC·Filed 2003·Granted Mar 21, 2006·2 cites·12 claims
- 1445US2011114597A1Barrier integration scheme for high-reliability viasTEXAS INSTRUMENTS INC·Filed 2010·Application pending·0 cites
- 1543US2009152059A1Rotational Resistance ApparatusWOMACK NATHAN PAUL·Filed 2007·Application pending·0 cites
- 1642US2008057701A1Method for prevention of resist poisoning in integrated circuit fabricationTEXAS INSTRUMENTS INC·Filed 2006·Application pending·0 cites
- 1734US6969880B2High capacitive density stacked decoupling capacitor structureTEXAS INSTRUMENTS INC·Filed 2003·Granted Nov 29, 2005·0 cites·19 claims
- 1833US5420071AMethods of forming local interconnections in semiconductor devicesFiled 1993·Granted May 30, 1995·7 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →