Inventor · disambiguated record
Eunsun Noh
Also filed as: NOH EUNSUN
19 granted patents·4 pending applications·21 citations·filing 2014–2023
90Inventor score
Top patents by PatentIndex Score
23 records- 0190US12477956B2Magnetic memory device including capping pattern on non-magnetic patternSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Nov 18, 2025·1 cites·19 claims
- 0289US10892196B2Magnetic property measuring system, a method for measuring magnetic properties, and a method for manufacturing a magnetic memory device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jan 12, 2021·4 cites·12 claims
- 0383US9985200B2Magnetic memory devices including oxidized non-magnetic patterns with non-metallic elements and methods of fabricating the sameLEE JOONMYOUNG·Filed 2017·Granted May 29, 2018·4 cites·29 claims
- 0481US11037611B2Magnetic property measuring systems, methods for measuring magnetic properties, and methods for manufacturing magnetic memory devices using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Jun 15, 2021·2 cites·14 claims
- 0578US11237224B2Magnetic property measuring systems, methods of measuring magnetic property, and methods of fabricating magnetic memory devices using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Feb 1, 2022·2 cites·9 claims
- 0678US10347819B2Magnetic memory devices having conductive pillar structures including patterning residue componentsSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jul 9, 2019·2 cites·15 claims
- 0773US9515255B2Methods of manufacturing semiconductor devices using cavities to distribute conductive patterning residuePARK JONGCHUL·Filed 2014·Granted Dec 6, 2016·2 cites·18 claims
- 0872US2023187287A1Magnetic property measuring system, a method for measuring magnetic properties, and a method for manufacturing a magnetic memory device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0971US11600537B2Magnetic property measuring system, a method for measuring magnetic properties, and a method for manufacturing a magnetic memory device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Mar 7, 2023·0 cites·10 claims
- 1071US11535930B2Sputtering apparatus and method of fabricating magnetic memory device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Dec 27, 2022·0 cites·15 claims
- 1170US11834738B2Sputtering apparatus and method of fabricating magnetic memory device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Dec 5, 2023·0 cites·7 claims
- 1266US11727973B2Magnetic property measuring systems, methods for measuring magnetic properties, and methods for manufacturing magnetic memory devices using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Aug 15, 2023·0 cites·6 claims
- 1364US10553790B1Method of manufacuring a magnetic memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Feb 4, 2020·1 cites·20 claims
- 1460US11205679B2Magnetic memory device including a free layer and a pinned layerSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Dec 21, 2021·0 cites·19 claims
- 1560US9634240B2Magnetic memory devicesPARK JONGCHUL·Filed 2014·Granted Apr 25, 2017·2 cites·18 claims
- 1651US2023117646A1Magnetic memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 1750US10497857B2Semiconductor devicesNOH EUNSUN·Filed 2017·Granted Dec 3, 2019·1 cites·17 claims
- 1848US10862025B2Magnetic memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Dec 8, 2020·0 cites·20 claims
- 1945US10957845B2Magnetic memory devices and methods of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Mar 23, 2021·0 cites·18 claims
- 2042US2022320418A1Magnetic memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Application pending·0 cites
- 2141US11227665B2Magnetic memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jan 18, 2022·0 cites·20 claims
- 2241US10622546B2Magnetic memory device and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Apr 14, 2020·0 cites·15 claims
- 2334US2019140163A1Magnetic memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →