Inventor · disambiguated record
Gary Janik
Also filed as: JANIK GARY · JANIK GARY R · TRAINOFF STEVEN P
50 granted patents·3 pending applications·1,180 citations·filing 1986–2017
99Inventor score
Files withKLA TENCOR TECH CORP30KLA TENCOR CORP8WYATT TECHNOLOGY4BENDER DAVID L3SANDISK TECHNOLOGIES LLC3
Top patents by PatentIndex Score
53 records- 0198US7433056B1Scatterometry metrology using inelastic scatteringKLA TENCOR TECH CORP·Filed 2005·Granted Oct 7, 2008·55 cites·20 claims
- 0295US7067819B2Systems and methods for measurement or analysis of a specimen using separated spectral peaks in lightKLA TENCOR TECH CORP·Filed 2004·Granted Jun 27, 2006·81 cites·22 claims
- 0395US6816570B2Multi-technique thin film analysis toolKLA TENCOR CORP·Filed 2002·Granted Nov 9, 2004·84 cites·70 claims
- 0494US7369233B2Optical system for measuring samples using short wavelength radiationKLA TENCOR TECH CORP·Filed 2003·Granted May 6, 2008·62 cites·227 claims
- 0594US6999180B1Optical film topography and thickness measurementKLA TENCOR TECH CORP·Filed 2003·Granted Feb 14, 2006·84 cites·22 claims
- 0693US7903260B1Scatterometry metrology using inelastic scatteringKLA TENCOR CORP·Filed 2010·Granted Mar 8, 2011·14 cites·48 claims
- 0793US7359052B2Systems and methods for measurement of a specimen with vacuum ultraviolet lightKLA TENCOR TECH CORP·Filed 2004·Granted Apr 15, 2008·46 cites·14 claims
- 0893US7039158B1Multi-technique thin film analysis toolKLA TENCOR TECH CORP·Filed 2004·Granted May 2, 2006·52 cites·28 claims
- 0993US6771735B2Method and apparatus for improved x-ray reflection measurementKLA TENCOR TECH CORP·Filed 2001·Granted Aug 3, 2004·60 cites·31 claims
- 1093US6711232B1X-ray reflectivity measurementKLA TENCOR TECH CORP·Filed 2003·Granted Mar 23, 2004·55 cites·20 claims
- 1192US7006596B1Light element measurementKLA TENCOR TECH CORP·Filed 2003·Granted Feb 28, 2006·43 cites·16 claims
- 1288US7166838B1X-ray imaging for patterned film measurementKLA TENCOR TECH CORP·Filed 2005·Granted Jan 23, 2007·12 cites·20 claims
- 1387US7764376B2Systems and methods for measurement of a specimen with vacuum ultraviolet lightKLA TENCOR TECH CORP·Filed 2009·Granted Jul 27, 2010·7 cites·22 claims
- 1487US7072442B1X-ray metrology using a transmissive x-ray optical elementKLA TENCOR TECH CORP·Filed 2002·Granted Jul 4, 2006·36 cites·12 claims
- 1586US9645093B2System and method for apodization in a semiconductor device inspection systemKLA TENCOR CORP·Filed 2015·Granted May 9, 2017·3 cites·46 claims
- 1686US7369235B1Method and system for measuring deep trenches in siliconKLA TENCOR CORP·Filed 2005·Granted May 6, 2008·10 cites·12 claims
- 1786US7220964B1Film thickness and composition measurement via auger electron spectroscopy and electron probe microanalysisKLA TENCOR TECH CORP·Filed 2005·Granted May 22, 2007·9 cites·23 claims
- 1885US7521946B1Electrical measurements on semiconductors using corona and microwave techniquesKLA TENCOR TECH CORP·Filed 2006·Granted Apr 21, 2009·12 cites·10 claims
- 1984US9852799B2Configuration parameter management for non-volatile data storageSANDISK TECHNOLOGIES INC·Filed 2015·Granted Dec 26, 2017·6 cites·17 claims
- 2084US9176069B2System and method for apodization in a semiconductor device inspection systemKLA TENCOR CORP·Filed 2013·Granted Nov 3, 2015·5 cites·44 claims
- 2183US7253901B2Laser-based cleaning device for film analysis toolKLA TENCOR TECH CORP·Filed 2002·Granted Aug 7, 2007·21 cites·28 claims
- 2282US7427757B1Large collection angle x-ray monochromators for electron probe microanalysisKLA TENCOR TECH CORP·Filed 2005·Granted Sep 23, 2008·6 cites·48 claims
- 2382US7075073B1Angle resolved x-ray detectionKLA TENCOR TECH CORP·Filed 2004·Granted Jul 11, 2006·21 cites·20 claims
- 2481US7564552B2Systems and methods for measurement of a specimen with vacuum ultraviolet lightKLA TENCOR TECH CORP·Filed 2004·Granted Jul 21, 2009·16 cites·38 claims
- 2581US6788760B1Methods and apparatus for characterizing thin filmsKLA TENCOR TECH CORP·Filed 2002·Granted Sep 7, 2004·26 cites·49 claims
- 2680US7139365B1X-ray reflectivity system with variable spotKLA TENCOR TECH CORP·Filed 2004·Granted Nov 21, 2006·16 cites·21 claims
- 2779US7274440B1Systems and methods for measuring stress in a specimenKLA TENCOR TECH CORP·Filed 2004·Granted Sep 25, 2007·21 cites·25 claims
- 2878US7202951B1Laser-based cleaning device for film analysis toolKLA TENCOR TECH CORP·Filed 2004·Granted Apr 10, 2007·14 cites·6 claims
- 2978US5530540ALight scattering measurement cell for very small volumesWYATT TECHNOLOGY·Filed 1994·Granted Jun 25, 1996·45 cites·17 claims
- 3077US5475235AControl of laser light power output for use in light scattering instruments by inducing mode hopping and averaging resultWYATT TECHNOLOY CORP·Filed 1993·Granted Dec 12, 1995·42 cites·26 claims
- 3176US8257496B1Crucible weight measurement system for controlling feedstock introduction in Czochralski crystal growthBENDER DAVID L·Filed 2008·Granted Sep 4, 2012·9 cites·4 claims
- 3274US10268396B2Systems and methods for managing storage enduranceSANDISK TECHNOLOGIES LLC·Filed 2017·Granted Apr 23, 2019·1 cites·20 claims
- 3374US5404217ALaser liquid flow cell manifold system and method for assemblyFiled 1993·Granted Apr 4, 1995·54 cites·27 claims
- 3473US7688454B1Scatterometry metrology using inelastic scatteringKLA TENCOR CORP·Filed 2008·Granted Mar 30, 2010·2 cites·20 claims
- 3573US7110113B1Film measurement with interleaved laser cleaningKLA TENCOR TECH CORP·Filed 2003·Granted Sep 19, 2006·12 cites·40 claims
- 3672US6786099B2Surface photo-acoustic film measurement device and techniqueKLA TENCOR TECH CORP·Filed 2002·Granted Sep 7, 2004·9 cites·40 claims
- 3770US4765736AFrequency modulation spectroscopy using dual frequency modulation and detectionELECTRIC POWER RES INST·Filed 1986·Granted Aug 23, 1988·29 cites·5 claims
- 3866US7623239B2Systems and methods for measurement of a specimen with vacuum ultraviolet lightKLA TENCOR TECH CORP·Filed 2008·Granted Nov 24, 2009·3 cites·19 claims
- 3966US6128080AExtended range interferometric refractometerWYATT TECHNOLOGY·Filed 1997·Granted Oct 3, 2000·33 cites·19 claims
- 4063US7295325B2Time-resolved measurement technique using radiation pulsesKLA TENCOR TECH CORP·Filed 2003·Granted Nov 13, 2007·4 cites·91 claims
- 4161US7196801B1Patterned substrate surface mappingKLA TENCOR TECH CORP·Filed 2004·Granted Mar 27, 2007·11 cites·18 claims
- 4261US7190441B1Methods and systems for preparing a sample for thin film analysisKLA TENCOR TECH CORP·Filed 2004·Granted Mar 13, 2007·9 cites·20 claims
- 4361US2012210931A1Methods for controlling melt temperature in a czochralski growerBENDER DAVID L·Filed 2011·Application pending·0 cites
- 4458US7495217B1Film thickness and composition measurement via auger electron spectroscopy and electron probe microanalysisKLA TENCOR CORP·Filed 2007·Granted Feb 24, 2009·0 cites·20 claims
- 4557US7109735B1Method for measuring gate dielectric properties for three dimensional transistorsKLA TENCOR TECH CORP·Filed 2005·Granted Sep 19, 2006·3 cites·16 claims
- 4657US5676830AMethod and apparatus for reducing band broadening in chromatographic detectorsWYATT TECHNOLOGY·Filed 1996·Granted Oct 14, 1997·18 cites·5 claims
- 4753US9766819B2Systems and methods for managing storage enduranceSANDISK TECHNOLOGIES LLC·Filed 2015·Granted Sep 19, 2017·0 cites·22 claims
- 4853US5900152AApparatus to reduce inhomogeneities in optical flow cellsWYATT TECHNOLOGY·Filed 1997·Granted May 4, 1999·17 cites·2 claims
- 4949US2013263772A1Method and apparatus for controlling melt temperature in a Czochralski growerBENDER DAVID L·Filed 2008·Application pending·0 cites
- 5048US10332604B2Configuration parameter management for non-volatile data storageSANDISK TECHNOLOGIES LLC·Filed 2017·Granted Jun 25, 2019·0 cites·20 claims
Showing the top 50 of 53 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →