Inventor · disambiguated record
Gustavo A. Pinto
Also filed as: PINTO GUSTAVO · PINTO GUSTAVO A
14 granted patents·4 pending applications·1,204 citations·filing 2000–2014
95Inventor score
Top patents by PatentIndex Score
18 records- 0198US7656170B2Multiple directional scans of test structures on semiconductor integrated circuitsKLA TENCOR TECH CORP·Filed 2007·Granted Feb 2, 2010·96 cites·12 claims
- 0297US7655482B2Chemical mechanical polishing test structures and methods for inspecting the sameKLA TENCOR·Filed 2007·Granted Feb 2, 2010·91 cites·10 claims
- 0396US6633174B1Stepper type test structures and methods for inspection of semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted Oct 14, 2003·195 cites·14 claims
- 0496US6433561B1Methods and apparatus for optimizing semiconductor inspection toolsKLA TENCOR CORP·Filed 2000·Granted Aug 13, 2002·159 cites·18 claims
- 0595US6509197B1Inspectable buried test structures and methods for inspecting the sameKLA TENCOR CORP·Filed 2000·Granted Jan 21, 2003·146 cites·24 claims
- 0695US6445199B1Methods and apparatus for generating spatially resolved voltage contrast maps of semiconductor test structuresKLA TENCOR CORP·Filed 2000·Granted Sep 3, 2002·106 cites·20 claims
- 0794US7012439B2Multiple directional scans of test structures on semiconductor integrated circuitsKLA TENCOR TECH CORP·Filed 2005·Granted Mar 14, 2006·21 cites·9 claims
- 0894US6576923B2Inspectable buried test structures and methods for inspecting the sameKLA TENCOR CORP·Filed 2002·Granted Jun 10, 2003·117 cites·13 claims
- 0992US6921672B2Test structures and methods for inspection of semiconductor integrated circuitsKLA TENCOR TECH CORP·Filed 2003·Granted Jul 26, 2005·59 cites·12 claims
- 1092US6566885B1Multiple directional scans of test structures on semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted May 20, 2003·57 cites·24 claims
- 1192US6528818B1Test structures and methods for inspection of semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted Mar 4, 2003·60 cites·19 claims
- 1291US7179661B1Chemical mechanical polishing test structures and methods for inspecting the sameKLA TENCOR·Filed 2000·Granted Feb 20, 2007·68 cites·14 claims
- 1385US6867606B2Multiple directional scans of test structures on semiconductor integrated circuitsKLA TENCOR TECHNOLOGIES INC·Filed 2003·Granted Mar 15, 2005·28 cites·6 claims
- 1462US8772772B2System and method for increasing productivity of combinatorial screeningWEINER KURT H·Filed 2006·Granted Jul 8, 2014·1 cites·32 claims
- 1554US2014315332A1System and Method for Increasing Productivity of Combinatorial ScreeningINTERMOLECULAR INC·Filed 2014·Application pending·0 cites
- 1651US2007202614A1Method and apparatus for combinatorially varying materials, unit process and process sequenceCHIANG TONY P·Filed 2007·Application pending·0 cites
- 1751US2007202610A1Method and apparatus for combinatorially varying materials, unit process and process sequenceCHIANG TONY P·Filed 2007·Application pending·0 cites
- 1842US2006292846A1Material management in substrate processingPINTO GUSTAVO A·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →